Patents by Inventor Hanjun Jiang

Hanjun Jiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization
    Patent number: 7587647
    Abstract: A method of testing an analog and/or mixed-signal circuit can be used in either a production or a built-in self test environment. The method includes generating an excitation signal for testing by using dynamic element matching for performance enhancement of the test signal generator that applies an excitation, and/or by measuring an output of the DUT using dynamic element matching for performance enhancement of an output measurement device. Signal generators and circuits using aspects of the method are also discussed.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: September 8, 2009
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
  • Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization
    Publication number: 20050057271
    Abstract: A method of testing an analog and/or mixed-signal circuit can be used in either a production or a built-in self test environment. The method includes generating an excitation signal for testing by using dynamic element matching for performance enhancement of the test signal generator that applies an excitation, and/or by measuring an output of the DUT using dynamic element matching for performance enhancement of an output measurement device. Signal generators and circuits using aspects of the method are also discussed.
    Type: Application
    Filed: July 30, 2004
    Publication date: March 17, 2005
    Inventors: Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall Geiger