Patents by Inventor Hanns-Georg Ochsenkuehn

Hanns-Georg Ochsenkuehn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9577770
    Abstract: A system for analyzing a probe card comprises a signal generator adapted to generate a radio frequency test signal. a connector for inputting into the probe card the radio frequency test signal, and a detector assembly. The detector assembly comprises an RF chuck for receiving a radio frequency signal from the probe card, and a sensor configured to receive the radio frequency signal from the RF chuck. The sensor is configured to measure a magnitude of the radio frequency signal and to output a measurement signal that represents only the magnitude of the radio frequency signal. The RF chuck and the sensor are mechanically coupled.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: February 21, 2017
    Assignees: APS Soutions GmbH, BE Precision Technology
    Inventors: Paul Oneil, Hanns-Georg Ochsenkuehn, Oscar Beijert
  • Publication number: 20160329974
    Abstract: A system for analyzing a probe card comprises a signal generator adapted to generate a radio frequency test signal. a connector for inputting into the probe card the radio frequency test signal, and a detector assembly. The detector assembly comprises an RF chuck for receiving a radio frequency signal from the probe card, and a sensor configured to receive the radio frequency signal from the RF chuck. The sensor is configured to measure a magnitude of the radio frequency signal and to output a measurement signal that represents only the magnitude of the radio frequency signal. The RF chuck and the sensor are mechanically coupled.
    Type: Application
    Filed: May 8, 2015
    Publication date: November 10, 2016
    Inventors: Paul Oneil, Hanns-Georg Ochsenkuehn, Oscar Beijert
  • Patent number: 6791349
    Abstract: An electrical component contains a pad formed of an electrically conductive material. The pad serves for the application of a contact element and is complemented by an electrically conductive edge strip. The pad and the edge strip are isolated from one another. The component which includes the pad on which misalignments or deformations of contact elements which occur in a functionality test can be detected easily and directly without additional analytical devices.
    Type: Grant
    Filed: March 27, 2003
    Date of Patent: September 14, 2004
    Assignee: Infineon Technologies AG
    Inventors: Detlef Nagel, Reinhart Buhr, Hanns-Georg Ochsenkühn, Jens Paul