Patents by Inventor Hannu Rintamaki

Hannu Rintamaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
    Patent number: 7409037
    Abstract: An X-ray fluorescence analyzer has a structure that defines a chamber (102). There is a window (103) to the chamber in a surface that is to come next to a sample (101) outside the chamber. The window (103) comprises a foil that is permeable to X-rays. A detector (104) receives fluorescent X-rays through said window (103). A low pressure source (508) is coupled to the chamber (102) and configured to controllably lower the pressure of a gaseous medium in the chamber (102) to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber (102) for the duration of an X-ray fluorescence measurement.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: August 5, 2008
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Erkki Tapani Puusaari, Hannu Rintamäki
  • X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
    Publication number: 20070269003
    Abstract: An X-ray fluorescence analyzer has a structure that defines a chamber (102). There is a window (103) to the chamber in a surface that is to come next to a sample (101) outside the chamber. The window (103) comprises a foil that is permeable to X-rays. A detector (104) receives fluorescent X-rays through said window (103). A low pressure source (508) is coupled to the chamber (102) and configured to controllably lower the pressure of a gaseous medium in the chamber (102) to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber (102) for the duration of an X-ray fluorescence measurement.
    Type: Application
    Filed: May 5, 2006
    Publication date: November 22, 2007
    Inventors: Erkki Puusaari, Hannu Rintamaki