Patents by Inventor Hans Dirk Wolf

Hans Dirk Wolf has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical monitoring system for coating processes
    Patent number: 9679793
    Abstract: The invention concerns an optical monitoring system for the measurement of layer thicknesses of thin coatings applied in a vacuum, particularly on moving substrates, during the coating process, in which the light intensity of the light of a light source injected into a reference light guide and released by a first piezoelectric or electrostrictive or magnetostrictive light chopper is registered by a light detector unit in a reference phase, the light of the light source in a measuring phase is injected into a first measuring light guide and the light released by a second piezoelectric or electrostrictive or magnetostrictive light chopper is directed to the substrate, and the light intensity of the light reflected or transmitted from the substrate is registered by the light detector unit through a second measuring light guide, and a remaining light intensity is registered by the light detector unit in at least one dark phase, wherein the reference phase, the measuring phase, and the dark phase are shifted in t
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: June 13, 2017
    Assignee: LEYBOLD OPTICS GMBH
    Inventors: Alfons Zoller, Hans Dirk Wolf, Christopher Schmitt, Michael Boos, Werner Klug
  • Optical Monitoring System for Coating Processes
    Publication number: 20090214760
    Abstract: The invention concerns an optical monitoring system for the measurement of layer thicknesses of thin coatings applied in a vacuum, particularly on moving substrates, during the coating process, in which the light intensity of the light of a light source injected into a reference light guide and released by a first piezoelectric or electrostrictive or magnetostrictive light chopper is registered by a light detector unit in a reference phase, the light of the light source in a measuring phase is injected into a first measuring light guide and the light released by a second piezoelectric or electrostrictive or magnetostrictive light chopper is directed to the substrate, and the light intensity of the light reflected or transmitted from the substrate is registered by the light detector unit through a second measuring light guide, and a remaining light intensity is registered by the light detector unit in at least one dark phase, wherein the reference phase, the measuring phase, and the dark phase are shifted in t
    Type: Application
    Filed: February 23, 2006
    Publication date: August 27, 2009
    Applicant: LEYBOLD oPTICS GMBH
    Inventors: Alfons Zoller, Hans Dirk Wolf, Christopher Schmitt, Michael Boos, Werner Klug