Abstract: In a device for testing and sorting electronic components, and more particularly integrated circuit chips, the untested components are arranged in parallel magazine channels, which are arranged on a gradient, of an input magazine. The tested components are collected in an output magazine set up in the same way. The magazines are to be suitable, more particularly, for taking up CC (chip carrier) components. These components have a free rear surface upon which they can slip in the magazine channels arranged on a gradient. The magazines consist of a flat base plate (15), upon which guide rails, which are T-shaped in cross section, are mounted in such a way that they limit the magazine channels at the side and at the top, the guide rails being connected with each other to form a block which, as a whole, is capable of being exchanged. The components are tested in a channel, their connecting contacts being connected up with corresponding test contacts.

Abstract: In the case of an apparatus for testing and sorting oblong, electronic components, more particularly integrated chips, the components, which have been supplied in a row, are separated by means of a separating arrangement. The separating arrangement consists of a belt conveyer, which is arranged above a slideway for the components which have been supplied and which takes hold of the components which have been supplied and pushes them forward on the slideway. A control signal, which is emitted by a detecting arrangement which is arranged after the separating arrangement, is used for the purpose of stopping the belt conveyer so that the component, which has just been delivered by the belt conveyer, can, in the first instance, be tested. After testing has taken place, the belt conveyer is set in operation again.