Abstract: A semiconductor memory has a plurality of modules or boards each with a plurality of memory integrated circuits and redundant memory areas. For receiving of information for replacement circuiting of faulty bit locations in a memory circuit with redundant memory areas, a volatile auxiliary memory is provided in the memory circuit. Each structural unit, which is easily exchangeable in the course of maintenance jobs which encompass a plurality of memory circuits such as a printed circuit board, has associated with it a programmable non-volatile read-only memory for receiving the replacement circuit information for all memory circuits which are combined in the structural unit. The programming of the read-only memory preferably proceeds during testing of the structural unit.