Patents by Inventor Hans Jürgen Eisen

Hans Jürgen Eisen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for determining physical collective parameters of particles of gases
    Patent number: 6674529
    Abstract: The present invention creates an apparatus for determining physical collective parameters of particles in gases, which comprises a measuring chamber with light entrance ports (121) and exit ports (123, 124) for electromagnetic radiation, an emission source (113) for electromagnetic radiation being provided and at least two detection apparatuses (114, 115) for determining the intensity of electromagnetic radiation scattered at the particles being provided, and the detection apparatuses (114, 115) detecting electromagnetic radiation of different scattering regions. The present invention further creates a method for determining physical collective parameters of particles in gases, the particles being exposed to electromagnetic radiation which is scattered at the particles, wherein the intensities of the scattered radiation of at least two different scattering regions are determined and their ratio is taken subsequently.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: January 6, 2004
    Assignee: BASF Aktiengesellschaft
    Inventors: Bernd Sachweh, Camiel Heffels, Matthias Rädle, Helmut Biermann, Hans Jürgen Eisen, Jürgen Ettmüller, Johannes G Reuvers