Abstract: An imaging system for generating a three dimensional image of tissue of a patient is provided. The imaging system comprises of a transmitter, receiver, antenna system and a display element to form a synthetic aperture radar system that displays a three dimensional view of the tissue. The SAR system has been configured to operate in the near field as opposed to current equipment which can only perform satisfactorily in the far field. A calibration technique has been utilized that allows the system to perform as well as other systems that operate using far field techniques but allows for a much simpler, cost effective system.

Abstract: An imaging system for generating a three dimensional image of tissue of a patient is provided. The imaging system comprises of a transmitter, receiver, antenna system and a display element to form a synthetic aperture radar system that displays a three dimensional view of the tissue. The SAR system has been configured to operate in the near field as opposed to current equipment which can only perform satisfactorily in the far field. A calibration technique has been utilized that allows the system to perform as well as other systems that operate using far field techniques but allows for a much simpler, cost effective system.

Abstract: The invention relates to a method for correcting errors by de-embedding scattering parameters of a device under test associated with measuring ports (11), the parameters being measured by a vector network analyzer including n measuring ports. The aim of the invention is to create a universal, precise and fast method of correcting errors of scattering parameters. To this end, the method includes the following steps: formula (1) two-port calibrations are carried out on different calibrating standards in any order in the active state between the measuring ports (11), as a basis for a first error correction; the reflection parameters of at least one part of the n measuring ports (11) are determined in the inactive state, by way of the results of two-port measurements carried out on at least one calibrating standard switched in the active and/or inactive state on measuring ports (11), as a basis for a second error correction.

Abstract: The invention relates to a method for correcting errors by de-embedding dispersion parameters of a measuring object associated with measuring gates (11), said parameters being measured by a vectorial network analyst comprising n measuring gates. The aim of the invention is to create a universal, precise and fast means of correcting errors of dispersion parameters. To this end, the method comprises the following steps: formula (1) two-port calibrations are carried out on different calibrating standards in any order in the active state between the measuring gates (11), as a basis for a first error correction; the reflection parameters of at least one part of the n measuring gates (11) are determined in the inactive state, by means of the results of two-port measurements carried out on at least one calibrating standard switched in the active and/or inactive state on measuring gates (11), as a basis for a second error correction.