Patents by Inventor Hans-Juergen Steiner

Hans-Juergen Steiner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8410987
    Abstract: A method for measuring a radiation field in the direct vicinity of a measured object is provided. One or more antenna measurement probe(s) are moved in any desired fashion within the radiation field, and a number of high-frequency measurement points is thus recorded. During the movement of the antenna measurement probe, a position determination of a respective antenna measurement probe is conducted simultaneously with or in close temporal proximity to the capture of a respective high-frequency measurement point, in order to assign a position to each high-frequency measurement point so as to generate a spatially defined measurement point cloud. Finally, radiation patterns at any distance from the measured object may be determined from the spatial measurement point cloud by means of a field transformation method.
    Type: Grant
    Filed: November 3, 2010
    Date of Patent: April 2, 2013
    Assignee: Astrium GmbH
    Inventors: Thomas Eibert, Torsten Fritzel, Carsten Schmidt, Hans-Juergen Steiner
  • Patent number: 8184051
    Abstract: A method of measuring a directional graph of a test antenna includes disposing a plurality of measuring probes relative to the test antenna, each being disposed at a different first predetermined height above a reference plane; disposing the test antenna at a second predetermined height above the reference plane; measuring transmission characteristics relative to the test antenna between each of the plurality of measuring probes and the test antenna; determining prevailing scatter characteristics of the reference plane; and determining the directional graph of the test antenna using the prevailing scatter characteristics.
    Type: Grant
    Filed: April 28, 2010
    Date of Patent: May 22, 2012
    Assignee: Astrium GmbH
    Inventors: Thomas Eibert, Torsten Fritzel, Carsten Schmidt, Hans-Juergen Steiner
  • Patent number: 8125621
    Abstract: A method and apparatus for wireless transmission of electrically complex or phase-critical signals includes a device for measuring the length of a transmission route to a moving platform, and a device for transmitting complex measuring or reference signals. According to the invention, components of the device for transmitting the signals are arranged adjacent components of the device for measuring the length of the transmission route, so that changes of the length of the transmission route are the same for both devices.
    Type: Grant
    Filed: May 18, 2009
    Date of Patent: February 28, 2012
    Assignee: Astrium GmbH
    Inventors: Torsten Fritzel, Hans-Juergen Steiner
  • Patent number: 7992348
    Abstract: A high-frequency measuring enclosure for measuring large test objects is formed by an air-supported membrane or textile construction of a spherical or ellipsoidal contour, which is substantially pervious to electromagnetic radiation. For absorption of residual electromagnetic radiation that may be reflected by the interior of the surface, the floor is covered with absorber material.
    Type: Grant
    Filed: November 30, 2006
    Date of Patent: August 9, 2011
    Assignee: Astrium GmbH
    Inventors: Torsten Fritzel, Hans-Juergen Steiner
  • Publication number: 20110102277
    Abstract: A method for measuring a radiation field in the direct vicinity of a measured object is provided. One or more antenna measurement probe(s) are moved in any desired fashion within the radiation field, and a number of high-frequency measurement points is thus recorded. During the movement of the antenna measurement probe, a position determination of a respective antenna measurement probe is conducted simultaneously with or in close temporal proximity to the capture of a respective high-frequency measurement point, in order to assign a position to each high-frequency measurement point so as to generate a spatially defined measurement point cloud. Finally, radiation patterns at any distance from the measured object may be determined from the spatial measurement point cloud by means of a field transformation method.
    Type: Application
    Filed: November 3, 2010
    Publication date: May 5, 2011
    Applicant: Astrium GmbH
    Inventors: Thomas EIBERT, Torsten Fritzel, Carsten Schmidt, Hans-Juergen Steiner
  • Publication number: 20100271262
    Abstract: A method of measuring a directional graph of a test antenna includes disposing a plurality of measuring probes relative to the test antenna, each being disposed at a different first predetermined height above a reference plane; disposing the test antenna at a second predetermined height above the reference plane; measuring transmission characteristics relative to the test antenna between each of the plurality of measuring probes and the test antenna; determining prevailing scatter characteristics of the reference plane; and determining the directional graph of the test antenna using the prevailing scatter characteristics.
    Type: Application
    Filed: April 28, 2010
    Publication date: October 28, 2010
    Applicant: ASTRIUM GMBH
    Inventors: Thomas EIBERT, Torsten FRITZEL, Carsten SCHMIDT, Hans-Juergen STEINER
  • Publication number: 20090284417
    Abstract: A method and apparatus for wireless transmission of electrically complex or phase-critical signals includes a device for measuring the length of a transmission route to a moving platform, and a device for transmitting complex measuring or reference signals. According to the invention, components of the device for transmitting the signals are arranged adjacent components of the device for measuring the length of the transmission route, so that changes of the length of the transmission route are the same for both devices.
    Type: Application
    Filed: May 18, 2009
    Publication date: November 19, 2009
    Applicant: Astrium GmbH
    Inventors: Torsten FRITZEL, Hans-Juergen Steiner
  • Publication number: 20080271387
    Abstract: A high-frequency measuring enclosure for measuring large test objects is formed by an air-supported membrane or textile construction of a spherical or ellipsoidal contour, which is substantially pervious to electromagnetic radiation. For absorption of residual electromagnetic radiation that may be reflected by the interior of the surface, the floor is covered with absorber material.
    Type: Application
    Filed: November 30, 2006
    Publication date: November 6, 2008
    Applicant: Astrium GmbH
    Inventors: Torsten Fritzel, Hans-Juergen Steiner