Abstract: An X-ray analysis system controls the humidity of a sample. The analysis system has a device for dividing a gas flow stream into two portions and for submerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturized gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample. This system and a method for its use allow measurements of samples to be made as a function of humidity and temperature over wide ranges of these parameters under highly stable conditions in a straightforward manner which are not susceptible to malfunction and which can be produced and operated at low cost.

Abstract: The invention concerns an X-ray analysis system for controlling the humidity of a sample, a method for its operation as well as a humidifying apparatus itself. The analysis system has means for dividing a gas flow stream into two portions and for emerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturize gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample.