Patents by Inventor Hans Thielemans

Hans Thielemans has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10267629
    Abstract: The present invention provides a dimensional measurement probe unit (100) for attachment to a probe head (200) of a localizer (300), comprising: a measurement probe (150) for dimensional measurement of an object (400); a revolute joint (170) integrated into the measurement probe (150); and a probe unit interface (120) for repeated dismountable connection to a probe head (200) wherein the probe unit interface (120) is revolutely connected to the measurement probe (150) by the revolute joint (170).
    Type: Grant
    Filed: April 8, 2015
    Date of Patent: April 23, 2019
    Assignee: NIKON METROLOGY NV
    Inventors: Frank Thys, Hans Thielemans, Raf Nysen, Laurens Van Horenbeek
  • Publication number: 20180135969
    Abstract: The disclosure relates to a system for measuring the position of an object in a measurement volume, including: an optical angular measurement device, disposed with static optics, configured for measurement of the an azimuth and elevation angle of the object in the measurement volume with respect to the optical angular measurement device, a range measurement device, disposed with static component, configured for measurement of the range of the object in the measurement volume. It further relates to a use of the system and a measurement method.
    Type: Application
    Filed: November 1, 2017
    Publication date: May 17, 2018
    Applicant: NIKON METROLOGY N.V.
    Inventors: Geert VANDENHOUDT, Patrick BLANCKAERT, Hans THIELEMANS
  • Publication number: 20150377606
    Abstract: The present invention relates to a metrology system (100) for dimensional measurement of an object (200) comprising a light-projection device (110), LPD, configured to project an image (112) onto the object (200); a position-measurement device (120), PMD, having a measurement volume, configured to determine the position and/or the orientation of the LPD (110) disposed within the measurement volume; a dimensional acquisition device (140), DAD, that is an optical non-contact probe rigidly attached to the LPD configured to acquire dimensional data of the object (200); and an adjustment unit (130) configured to adjust the projected image (112) to have an essentially static appearance in relation to the object (200), which adjustment is responsive to movement of the LPD (110) detected by the PMD (120); wherein the image projected by the LPD (110) conveys feedback information to the user responsive to dimensional acquisition by the DAD (140).
    Type: Application
    Filed: February 24, 2014
    Publication date: December 31, 2015
    Applicant: Nikon Metrology N.V.
    Inventor: Hans Thielemans
  • Publication number: 20140043622
    Abstract: The disclosure relates to a system for measuring the position of an object in a measurement volume, including: an optical angular measurement device, disposed with static optics, configured for measurement of the an azimuth and elevation angle of the object in the measurement volume with respect to the optical angular measurement device, a range measurement device, disposed with static component, configured for measurement of the range of the object in the measurement volume. It further relates to a use of the system and a measurement method.
    Type: Application
    Filed: February 17, 2012
    Publication date: February 13, 2014
    Applicant: NIKON METROLOGY N.V.
    Inventors: Geert Vandenhoudt, Patrick Blanckaert, Hans Thielemans