Patents by Inventor Hans Ullrich Danzebrink

Hans Ullrich Danzebrink has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8345260
    Abstract: A method of detecting a movement of a measuring probe provided between an objective lens adapted to image an object plane on a predetermined image plane and the object plane is disclosed. Additionally, a measuring instrument comprising an objective lens and a measuring probe is disclosed. An input beam of light is split into a measurement beam and a reference beam. The measurement beam is focused on a reverse focal plane of the objective lens such that the measurement beam is collimated by the objective lens. The collimated measurement beam is reflected at the measuring probe. The reflected measurement beam is directed towards the objective lens such that the objective lens focuses the reflected measurement beam on the reverse focal plane. The reflected measurement beam is collimated. The collimated reference beam and the reference beam are superimposed to form a superimposed beam and an interference between the reflected measurement beam and the reference beam is detected.
    Type: Grant
    Filed: August 25, 2009
    Date of Patent: January 1, 2013
    Assignees: Mitutoyo Corporation, Bundesrepublik Deutschland, Endvertreten Durch den Prasidenten der Physikalisch-Technischen Bundesan
    Inventors: Hartmut Illers, Kazuhiko Hidaka, Akinori Saito, Hans Ullrich Danzebrink
  • Publication number: 20100067021
    Abstract: A method of detecting a movement of a measuring probe provided between an objective lens adapted to image an object plane on a predetermined image plane and the object plane is disclosed. Additionally, a measuring instrument comprising an objective lens and a measuring probe is disclosed. An input beam of light is split into a measurement beam and a reference beam. The measurement beam is focused on a reverse focal plane of the objective lens such that the measurement beam is collimated by the objective lens. The collimated measurement beam is reflected at the measuring probe. The reflected measurement beam is directed towards the objective lens such that the objective lens focuses the reflected measurement beam on the reverse focal plane. The reflected measurement beam is collimated. The collimated reference beam and the reference beam are superimposed to form a superimposed beam and an interference between the reflected measurement beam and the reference beam is detected.
    Type: Application
    Filed: August 25, 2009
    Publication date: March 18, 2010
    Applicants: MITUTOYO CORPORATION, BUNDESANSTALT
    Inventors: Hans-Ullrich Danzebrink, Kazuhiko Hidaka, Hartmut Illers, Akinori Saito