Patents by Inventor Hans-Ulrich Dassler

Hans-Ulrich Dassler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5796485
    Abstract: An apparatus and a method are presented in order to carry out an automatic optical inspection of an off-center rotating component to be measured. Using a measurement procedure which avoids mechanical contact having a source producing parallel rays and a detecting means, the off-center rotating component is rotated about a rotational axis, whereby a motion of the detecting means is synchronized with the rotation and is carried out in such a fashion that the separation, in the direction of an optical axis, between the off-center rotating component and the detecting means remains constant. In this manner optical distortions are avoided which would otherwise occur in the optical measurement procedure.
    Type: Grant
    Filed: July 17, 1996
    Date of Patent: August 18, 1998
    Assignee: Steinheil Industrielle Messtechnik GMBH
    Inventors: Hans-Ulrich Dassler, Rudiger Haas, Johann Lang
  • Patent number: 5331174
    Abstract: To automatically examine medical ampuls to determine their dimensional accuracy, the ampuls are moved in a horizontal position on a chain conveyor in a cadenced manner through an optoelectronic testing station. At the testing station, each ampul is lifted out of the chain conveyor and illuminated by light from a diffusely radiating illumination source perpendicularly to the longitudinal axis of the ampul. In the case of one-point-cut ampuls, the ampuls are rotated about their longitudinal axes during the testing process. The light passing through the ampul is received by a photodiode camera system which converts the images into electrical image signals. These image signals are evaluated with respect to their changes in intensity produced by the tested ampul in order to generate measurement values for the desired ampul dimensions and, if applicable, for their deviations from standard ampul dimensions.
    Type: Grant
    Filed: February 5, 1993
    Date of Patent: July 19, 1994
    Assignee: Schott Glaswerke
    Inventors: Hans-Ulrich Dassler, Rudiger Haas, Johann Lang
  • Patent number: 4807995
    Abstract: A bottle is moved over a sector of a circular path and simultaneously rotated around its longitudinal axis for the opto-electronic inspection of the mouth area for chipping of the glass. The bottle is guided through the beam path of a measuring apparatus on its way over the circular path. A measuring beam passes at an oblique angle to the longitudinal axis of the bottle in the area of the mouth opening. The location dependent scanning signal generated by the measuring apparatus during each scan corresponding to every discrete angular position of the bottle displays a characteristic intensity modulation. The presence of a chip in the glass may be recognized in the scanning signal by the absence of the intensity maximum present at the location of a chip. The absence of the intensity maximum may be ascertained by measuring the distance between two adjacent intensity maxima and comparing the measured distance with a reference value.
    Type: Grant
    Filed: July 7, 1986
    Date of Patent: February 28, 1989
    Assignee: OEM Messtechnik GmbH
    Inventors: Hans-Ulrich Dassler, Ruediger Haas, Gerhard Loeffler, Lutz Liebers
  • Patent number: 4785193
    Abstract: An opto-electronic measuring bench for the automatic dimensional inspection of externally turned parts, where the test object is linearly illuminated and an image of two diametrically opposed contour points produced on two rows of photodiodes. The diameter of the shafts may be determined from the position of the images of the two contour points recognized as intensity jumps and the electrically determined distance of the two rows of diodes. The rows of diodes may be moved together with the light sources in the axial direction of the test object, in order to carry out diameter measurements over the entire axial length of the test object. The distance of the diode rows in the axial direction from a starting position is also determined electrically, so that length measurements of the test object are also possible.
    Type: Grant
    Filed: June 13, 1986
    Date of Patent: November 15, 1988
    Assignee: OEM Messtechnik GmbH
    Inventors: Hans-Ulrich Dassler, Rudiger Haas, Gerhard Loffler