Abstract: A spectrometer (1) for reflection measurement contains a rotatable mirror arrangement (5) which is movable about an optical axis (21) between at least one measuring location (12) and a reference position (10), so that the measuring and reference conditions are largely identical. The rotatable mirror arrangement (5) and the reference sample(s) are arranged in a closed housing (13). The measuring samples (11) are placed on a receiving location (15) on the outer wall (14) of the housing (13). The spectrometer (1) with a rotatable mirror arrangement (5) may be applied for multiple referencing.

Abstract: An Ion cyclotron resonance spectrometer comprises a first cell (8) which can be evacuated to a normal high vacuum and which is coupled with means (17, 18) for ionizing a sample substance. The first cell (8) is connected with a second cell (11) via a partition wall (15) provided with a small opening (14), which second cell (11) comprises an ion trap (27, 31) located in the homogenous area of the magnet arrangement (1, 2) and adapted for determining ion cyclotron resonances. The second cell (11) can be evacuated to a superhigh vacuum. The first cell (8) comprises an area located outside the magnet arrangement (1, 2) which lies still within the stray field of the magnet arrangement and which may be provided with an additional magnet (35) so that any desired substance can be ionized therein by any suitably adapted equipment.

Abstract: In a procedure for recording ion-cyclotron resonance spectra or an apparatus for carrying out the procedure, gaseous ions of a sample substance in an ultrahigh vacuum are simultaneously exposed to a constant magnetic field B.sub.O and to a high frequency field which is perpendicular to it, with resonances being excited when the frequency of the alternating field corresponds to the rotational frequency of the ions which move on circular paths in the constant magnetic field. To produce gaseous ions of the sample substance, the latter is bombarded with additional gaseous, high-energy ions of a primary substance. The primary ions are produced in the measuring cell by means of an electron beam and excited to a high energy level by means of ion-cyclotron resonance (FIG. 2).

Abstract: In the calibration of ion cyclotron resonance spectrometers there may be used the first upper sideband of the resonance frequency of known sample substances because it was found that the frequency of the first upper sideband is approximately equal to the true cyclotron resonance frequency .omega..sub.c =(q/m)B. If only one line is available for the calibration, the frequency .omega..sub.R of the first upper sideband is set equal to the true cyclotron resonace frequency .omega..sub.c in the relation ##EQU1## which is used for calibration. If multiple lines are available, a more exact calibration is possible by using the relation ##EQU2## where .omega..sub.cor is a correction frequency. The effective resonance frequency .omega..sub.eff is separated from the upper sideband by a value .DELTA..omega. which, in a good approximation, is independent of m/q.

Abstract: In ion cyclotron resonance spectroscopy, a gaseous sample substance contained in a measuring cell and exposed to a constant magnetic field therein is ionized and is subsequently subjected to an electric HF measuring field oriented orthogonally to the magnetic field. The frequencies of the electric field encompass the frequencies of the cyclotron resonance frequencies of the ions of the sample substance. Sample substances often include ions which are of no interest to the material under study but which produce very strong lines that can be highly disturbing because of the limited dynamics of the spectrometer and, especially, the relatively low concentration of ions in the measuring cell which is necessary to prevent space charge effects.