Patents by Inventor Hao-Liang Lo

Hao-Liang Lo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing system for semiconductor memory device
    Patent number: 6986082
    Abstract: A testing architecture for a semiconductor memory device is described. The testing architecture comprises a microprocessor, as well as a result sorting and display device. When a start signal is received by the microprocessor, a clock signal is output from the microprocessor to the semiconductor memory device so that a data storing signal is output from the memory device to the microprocessor. When the data storing signal is received by the microprocessor, the data storing signal is tested and compared, and a testing result signal is output. The resorting and display device is used to output the start signal to the microprocessor, receive the result signal, and sort the result signal so as to display whether data stored by the semiconductor memory device is correct.
    Type: Grant
    Filed: June 28, 2001
    Date of Patent: January 10, 2006
    Assignee: Winbond Electronics Corp.
    Inventors: Kun-Ti Hsiao, Hao-Liang Lo, Li-Yang Yang
  • Testing architecture for a semiconductor memory device
    Publication number: 20030005372
    Abstract: A testing architecture for a semiconductor memory device is described. The testing architecture comprises a microprocessor, as well as a result sorting and display device. When a start signal is received by the microprocessor, a clock signal is output from the microprocessor to the semiconductor memory device so that a data storing signal is output from the memory device to the microprocessor. When the data storing signal is received by the microprocessor, the data storing signal is tested and compared, and a testing result signal is output. The resorting and display device is used to output the start signal to the microprocessor, receive the result signal, and sort the result signal so as to display whether data stored by the semiconductor memory device is correct.
    Type: Application
    Filed: June 28, 2001
    Publication date: January 2, 2003
    Inventors: K. T. Hsiao, Hao-Liang Lo, Li-Yang Yang