Patents by Inventor Hao TIENG

Hao TIENG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240097444
    Abstract: Embodiments of the present invention provide a hybrid system and method for distributed virtual power plants integrated intelligent net zero. In this method, a cyber physical agent (CPA) is utilized to collect a carbon emission information and an energy management information, and then an artificial intelligence (AI) optimization model of an intelligent central dispatch platform is utilized to obtain a power dispatch manner of the distributed virtual power plants based on the carbon emission information and the energy management information, such that the power dispatch manner of the distributed virtual power plants meets the requirements of enterprise economic benefits and net zero carbon emissions at the same time.
    Type: Application
    Filed: November 1, 2022
    Publication date: March 21, 2024
    Inventors: Ting-Chia OU, Hao TIENG, Fan-Tien CHENG, Tsung-Han TSAI, Yu-Yong LI
  • Publication number: 20240095755
    Abstract: A hybrid method for green intelligent manufacturing (GiM) combines the carbon reduction and the energy saving into the intelligent manufacturing based Industry 4.1 cloud platform. GiM assists companies to achieve the goal of net zero transition and help them advance to Industry 4.2 as soon as possible by simultaneously taking carbon footprint and energy issues into account. GiM collects large volumes of essential data (including carbon footprint) via cyber physical agents (CPAs), and sends them to two critical services of carbon management and intelligent energy management system (iEMS) deployed on the cloud platform. The two critical services optimize the energy dispatch schedule by strictly following the requirements of energy saving, carbon reduction, and net zero. Then, the state of zero defects of intelligent manufacturing achieved in Industry 4.1 can be upgraded to net zero of GiM in Industry 4.2.
    Type: Application
    Filed: November 1, 2022
    Publication date: March 21, 2024
    Inventors: Hao TIENG, Fan-Tien CHENG, Ting-Chia OU, Tsung-Han TSAI, Yu-Yong LI
  • Patent number: 10345794
    Abstract: A product quality prediction method for mass customization is provided. When a production system has a status change, data of sets of process parameters and actual measurement values of workpiece samples processed before the status change occurs, and data of sets of process parameters and actual measurement values of few workpiece samples processed after the status change occurs are used for build or retrain a prediction model, thereby predicting a metrology value of a next workpiece.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: July 9, 2019
    Assignee: NATIONAL CHENG KUNG UNIVERSITY
    Inventors: Chun-Fang Chen, Hao Tieng, Fan-Tien Cheng, Haw-Ching Yang
  • Publication number: 20180188717
    Abstract: A product quality prediction method for mass customization is provided. When a production system has a status change, data of sets of process parameters and actual measurement values of workpiece samples processed before the status change occurs, and data of sets of process parameters and actual measurement values of few workpiece samples processed after the status change occurs are used for build or retrain a prediction model, thereby predicting a metrology value of a next workpiece.
    Type: Application
    Filed: October 26, 2017
    Publication date: July 5, 2018
    Inventors: Chun-Fang CHEN, Hao TIENG, Fan-Tien CHENG, Haw-Ching YANG
  • Publication number: 20170323213
    Abstract: A digital marking processing apparatus includes a central control unit, and a processing quality prediction unit, a processing unit and a marking unit which are respectively connected with the central control unit electrically. The processing quality prediction unit can implement a virtual processing quality prediction method to predict the processing quality of the workpiece, output an accurate data of quality to the central control unit and generate tool path for the processing unit to process the workpiece. The central control unit is able to compile the data of quality from the processing quality in prediction unit into file information, so that the marking unit can then utilize the file information to correspondingly mark barcode or other digital pattern on the workpiece, which facilitate workpiece management and information disclosure.
    Type: Application
    Filed: May 4, 2017
    Publication date: November 9, 2017
    Inventors: PO CHENG SU, Hsin Hong Hou, Fan Tien Cheng, Haw Ching Yang, Hao Tieng
  • Publication number: 20170322549
    Abstract: A processing apparatus includes a processing unit for processing the workpiece, a processing quality prediction unit connected with the processing unit electrically, a signal interpretation unit connected with the processing quality prediction unit electrically, and a control unit connected with both the processing unit and the signal interpretation unit electrically, wherein when the processing unit is processing the workpiece, the processing quality prediction unit detects the processing signal and sends the signal to the signal interpretation unit, wherein when the signal interpretation unit interprets the processing signal, if there is abnormality in the processing signal, the signal interpretation unit will immediately notify the control unit to stop the processing unit from operating.
    Type: Application
    Filed: May 4, 2017
    Publication date: November 9, 2017
    Inventors: Po Cheng SU, Hsin Hong Hou, Fan Tien Cheng, Haw Ching Yang, Hao Tieng
  • Publication number: 20170322537
    Abstract: A processing apparatus with vision-based measurement includes a central control unit and a workpiece transporting unit, a vision-based measurement unit, a processing quality prediction unit, and a processing unit that are respectively connected to the central control unit electrically. The workpiece transporting unit is controlled by the central control unit to transport the workpiece to the vision-based measurement unit to be measured. The data obtained by the vision-based measurement unit from measuring the workpiece is provided to the processing quality prediction unit for conducting quality prediction. The processing quality prediction unit implements a virtual processing quality prediction method to establish a quality prediction model, wherein the workpiece transporting unit is utilized to assist the processes of establishing or modifying the model.
    Type: Application
    Filed: May 4, 2017
    Publication date: November 9, 2017
    Inventors: PO CHENG SU, Hsin Hong Hou, Fan Tien Cheng, Haw Ching Yang, Hao Tieng
  • Publication number: 20170322186
    Abstract: A processing apparatus includes a processing quality prediction unit capable of outputting workpiece surface processing signal, a storage unit capable of storing workpiece surface processing signal, and a workpiece surface information management unit capable of interpreting workpiece surface processing signal. The workpiece surface information management unit can convert the surface processing signal into data of workpiece surface quality. The workpiece surface information management unit can be utilized to respectively interpret the surface processing signals provided by the processing quality prediction unit and to convert them into data of the roughness degree of the workpiece surface texture, so as to clearly provide information regarding the quality of the workpiece surface and completely utilize the signals detected during the processing for increasing the value added of the processing apparatus and enhancing the efficiency of use of the processing apparatus.
    Type: Application
    Filed: May 4, 2017
    Publication date: November 9, 2017
    Inventors: PO CHENG SU, Hsin Hong Hou, Fan Tien Cheng, Haw Ching Yang, Hao Tieng
  • Publication number: 20170322547
    Abstract: A processing apparatus includes a central control unit, and a processing quality prediction unit, a processing unit, and a tool compensation unit which are respectively connected with the central control unit electrically. The processing quality prediction unit implements a virtual processing quality prediction method to predict the processing quality of the workpiece, output an accurate data of quality to the central control unit, and generate tool path for the processing unit to process the workpiece. The central control unit judges the data from the processing quality prediction unit and outputs the data to the tool compensation unit to calculate tool compensation data. The tool compensation unit provides the tool compensation data to the processing quality prediction unit to form a new processing path. Then the processing unit implements the compensated processing path to process the workpiece.
    Type: Application
    Filed: May 4, 2017
    Publication date: November 9, 2017
    Inventors: PO CHENG SU, Hsin Hong Hou, Fan Tien Cheng, Haw Ching Yang, Hao Tieng
  • Patent number: 9508042
    Abstract: A virtual metrology based method for predicting machining quality of a machine tool is provided. In this method, each product accuracy item is correlated with operation paths of the machine tool. During a modeling stage, the machine tool is operated to process workpiece samples, and sample sensing data of the workpiece samples associated with the operation paths are collected during the operation of the machine tool. The sample sensing data of each workpiece sample is de-noised and converted into the sample feature data corresponding to each feature type. The workpiece samples are measured with respect to the product accuracy item and integrated into the feature data for building a predictive model, thereby obtaining quality predicted data for each product accuracy item. During a usage stage, accuracy item values of a workpiece are predicted using the feature data during processing the workpiece in accordance with the predictive models.
    Type: Grant
    Filed: November 1, 2013
    Date of Patent: November 29, 2016
    Assignee: NATIONAL CHENG KUNG UNIVERSITY
    Inventors: Haw-Ching Yang, Hao Tieng, Min-Hsiung Hung, Fan-Tien Cheng
  • Publication number: 20140129503
    Abstract: A virtual metrology based method for predicting machining quality of a machine tool is provided. In this method, each product accuracy item is correlated with operation paths of the machine tool. During a modeling stage, the machine tool is operated to process workpiece samples, and sample sensing data of the workpiece samples associated with the operation paths are collected during the operation of the machine tool. The sample sensing data of each workpiece sample is de-noised and converted into the sample feature data corresponding to each feature type. The workpiece samples are measured with respect to the product accuracy item and integrated into the feature data for building a predictive model, thereby obtaining quality predicted data for each product accuracy item. During a usage stage, accuracy item values of a workpiece are predicted using the feature data during processing the workpiece in accordance with the predictive models.
    Type: Application
    Filed: November 1, 2013
    Publication date: May 8, 2014
    Applicant: NATIONAL CHENG KUNG UNIVERSITY
    Inventors: Haw-Ching YANG, Hao TIENG, Min-Hsiung HUNG, Fan-Tien CHENG