Patents by Inventor Haolin Gu

Haolin Gu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8909999
    Abstract: A dynamic voltage scaling system based on on-chip monitoring and voltage prediction is disclosed, comprising a main circuit that has integrated on-chip monitoring circuits, a supply voltage scaling module, and voltage converters, wherein, the supply voltage scaling module comprises a sampling and statistics module designed to calculate the error rate of the main circuit in the current time slice, a state recording module designed to record the error rate and the corresponding supply voltage, an error prediction module, and a state transition probability generation module; the error prediction module predicts the error trend of the main circuit in a future time slice according to the state recording module and the state transition probability generation module, and generates regulation signals and sends to the corresponding voltage converters, so as to generate the voltage required for operation of the entire main circuit.
    Type: Grant
    Filed: October 17, 2011
    Date of Patent: December 9, 2014
    Assignee: Southeast University
    Inventors: Longxing Shi, Weiwei Shan, Jun Yang, Haolin Gu, Xinning Liu, Yang Zhang
  • Publication number: 20130154583
    Abstract: The present invention discloses a dynamic voltage scaling system based on on-chip monitoring and voltage prediction, comprising a main circuit that has integrated on-chip monitoring circuits, a supply voltage scaling module, and voltage converters, wherein, the supply voltage scaling module comprises a sampling and statistics module designed to calculate the error rate of the main circuit in the current time slice, a state recording module designed to record the error rate and the corresponding supply voltage, an error prediction module, and a state transition probability generation module; the error prediction module predicts the error trend of the main circuit in a future time slice according to the state recording module and the state transition probability generation module, and generates regulation signals and sends to the corresponding voltage converters, so as to generate the voltage required for operation of the entire main circuit.
    Type: Application
    Filed: October 17, 2011
    Publication date: June 20, 2013
    Applicant: SOUTHEAST UNIVERSITY
    Inventors: Longxing Shi, Weiwei Shan, Jun Yang, Haolin Gu, Xinning Liu, Yang Zhang