Patents by Inventor Hardy Dallabetta

Hardy Dallabetta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for testing electronic components
    Patent number: 7221180
    Abstract: A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: May 22, 2007
    Assignee: Infineon Technologies AG
    Inventors: Hardy Dallabetta, Walter Diez, Franz Stegerer
  • Device and method for testing electronic components
    Publication number: 20060132156
    Abstract: A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.
    Type: Application
    Filed: December 23, 2005
    Publication date: June 22, 2006
    Inventors: Hardy Dallabetta, Walter Diez, Franz Stegerer