Abstract: Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coupled to the processor. The processor is configured to interrupt an application pattern running on the device under test. In response to interrupting the application pattern, the processor is configured to cause a control pattern to run on the device under test and then cause the application pattern to restart running from the point of interruption on the device under test.

Abstract: A weight lifting free-weight support method and apparatus comprising a support frame connected to at least one retractor assembly comprising a first and second reel having a locked and unlocked condition and an elongated strap with a first end and second end, the second end attached to a weight lifting free-weight, the first end having first and second spooling portions diverging from each other, the first spooling portion connected to the first reel and the second spooling portion connected to the second reel such that when the reels are in the unlocked condition the elongated strap is allowed to travel freely along a user-defined path relative to the support frame, and when at least one of the reels is in the locked condition, the spooling portions are prevented from unspooling from the reels, the locked condition triggered by unspooling the spooling portions at a rate greater than a predetermined rate.

Abstract: Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coupled to the processor. The processor is configured to interrupt an application pattern running on the device under test. In response to interrupting the application pattern, the processor is configured to cause a control pattern to run on the device under test and then cause the application pattern to restart running from the point of interruption on the device under test.

Abstract: A method for characterizing circuit activity in an IC. Generally, the method comprises the steps of activating an IC, resolving the switching activity in space and time, and generating a representation of the switching behavior which differentiates the time that circuits or transistors switch. One embodiment of the invention, utilizes a method such as, but not limited to, time resolved photon emission to observe transistor level switching activity in an integrated circuit (IC).