Abstract: A test fixture useful in testing printed circuit boards requires wire-wrapping only on a single side of a single board and is characterized by a reduced signal path length. The test fixture is provided with a translator device for conducting signals between system contact points in a testing system and contact points corresponding to selected locations on a unit-under-test ("UUT"). The translator device includes extended system pins, non-extended system pins, UUT pins and through-posts. On one side of the translator board, the UUT pins are wire-wrapped to the extended system pins wherever space allows, and otherwise to the through pins. The through pins make electrical contact to the non-extended system pins by means of conductive pads disposed on the other side of the translator board. A method of fabricating such a test fixture includes the step of computing optimal UUT and through-post locations.