Abstract: An advanced co-fired multichip/hybrid package comprises a castellated base, each castellation leading to a pad. An insulated wall rises from the leads, but not from the pads, and is topped by a kovar sealing ring and a layer of solder. A board of chips or other electronic components has a plurality of metallized vias extending therethrough, each via being in registration with a pad and having a ball of solder placed in it. A kovar lid is placed on the wall, and the entire apparatus is fired and cooled. The solder on the wall seals the lid to the wall, and the solder ball in each via bonds the board both mechanically and electrically to the base. No wire bond is needed.

Abstract: An advanced co-fired multichip hybrid package comprises a castellated base, each castellation leading to a pad. An insulated wall rises from the leads, but not from the pads, and is topped by a kovar sealing ring and a layer of solder. A board of chips or other electronic components has a plurality of metallized vias extending therethrough, each via being in registration with a pad and having a ball of solder placed in it. A kovar lid is placed on the wall, and the entire apparatus is fired and cooled. The solder on the wall seals the lid to the wall, and the solder ball in each via bonds the board both mechanically and electrically to the base. No wire bond is needed.

Abstract: A novel method and apparatus for detecting leaks in glass-to-metal seals of microelectronic devices and the like are described which comprise a double-gasketed vacuum station including a base plate having a central hole and a first gasket for exposing one side of the seals to a leak detector; a vacuum fixture surrounding the device provides a marginal region therearound which can be evacuated to prevent helium from permeating the first gasket; the vacuum fixture includes a central opening to expose the other side of the seals to a helium-containing atmosphere within a shroud enclosing the device and vacuum fixture; a second gasket provides a seal between the vacuum fixture and device periphery at the central opening in the fixture. For leak tests under controlled time/temperature conditions, an adjacent infrared lamp is used to radiantly heat the package containing the glass-to-metal seals, and a mask is included to avoid direct radiant heating of the gaskets and glass-to-metal seals.