Abstract: A cell grading test fixture includes an array of cell sockets electrically interconnected in series so that current through the entire array of cells flows through each of the cells once inserted into the fixture. Associated with each socket is an indicator which indicates to the operator when a cell voltage has fallen to a predetermined level. Each socket of the test fixture includes a spring-loaded switch contact such that upon removal of a cell which has dropped below a threshold voltage, the movable contact engages the contact of an adjacent socket, shorting out the cell location such that the series circuit of cells continues to provide a current path for the remaining cells.