Abstract: Systems and methods are provided that may be implemented to identify and track layer changes of an integrated circuit (IC) device, e.g., during any one of circuit design, pattern generation, device fabrication and/or chip failure analysis processes. Multiple revisions and variants of different IC layers may be identified and tracked using a tracking system and standardized labeling scheme that employs a combination of identifier characters and identifier structures that may be further implemented using revision layer identification parameterized cells (layerID PCells and BooleanID PCells) that include such identifier characters and/or structures The disclosed tracking systems may be further implemented in an automated manner and/or in a manner that allows programming of various parts/aspects and layerID PCells and BooleanID PCells of the tracking system.

Abstract: Systems and methods are provided that may be implemented to identify and track layer changes of an integrated circuit (IC) device, e.g., during any one of circuit design, pattern generation, device fabrication and/or chip failure analysis processes. Multiple revisions and variants of different IC layers may be identified and tracked using a tracking system and standardized labeling scheme that employs a combination of identifier characters and identifier structures that may be further implemented using revision layer identification parameterized cells (layerID PCells and BooleanID PCells) that include such identifier characters and/or structures The disclosed tracking systems may be further implemented in an automated manner and/or in a manner that allows programming of various parts/aspects and layerID PCells and BooleanID PCells of the tracking system.

Abstract: In one embodiment, the present invention includes a method for obtaining a physical layout for an integrated circuit (IC) design of a substrate having at least one of an n-well and a deep n-well; and extracting a layout netlist for the IC design from the physical layout by identifying the substrate as a single region. In such manner, short circuits isolated by the n-well or the deep n-well can be detected.

Abstract: In one embodiment, the present invention includes a method for obtaining a physical layout for an integrated circuit (IC) design of a substrate having at least one of an n-well and a deep n-well; and extracting a layout netlist for the IC design from the physical layout by identifying the substrate as a single region. In such manner, short circuits isolated by the n-well or the deep n-well can be detected.