Abstract: A measuring apparatus that measures signal-under-test of which signal level is changed at a predetermined bit time interval is provided. The measuring apparatus includes: a strobe timing generator that sequentially generates strobes arranged at substantially even time intervals; a level comparison section that detects the level of the signal-under-test at a timing at which each strobe is sequentially provided; a capture memory that stores therein the signal level outputted by the level comparison section; and a digital signal processing section that calculates a measurement result of the signal-under-test based on data series including data which have substantially even time intervals and each of which interval is larger than a bit time interval of the signal-under-test.

Abstract: There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a threshold voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.