Abstract: Embodiments of the invention generally provide methods for forming amorphous silicon-based photovoltaic devices, such as solar cells, by utilizing deposition and plasma treatment steps during a plasma-enhanced chemical vapor deposition (PE-CVD) process. In one embodiments, the method includes exposing a transparent conductive oxide (TCO) layer disposed on a substrate to hydrogen plasma during pretreatment, forming a p-type ?-Si film on the TCO layer, forming an ?-Si intrinsic film on the p-type ?-Si film during a PE-CVD process, and forming an n-type ?-Si film on the ?-Si intrinsic film. In some examples, the PE-CVD process includes depositing an ?-Si intrinsic layer during a deposition step, treating the ?-Si intrinsic layer to form a treated ?-Si intrinsic layer during a plasma treatment step, and sequentially repeating the deposition step and the plasma treatment step until obtaining a desired thickness of the ?-Si intrinsic film containing a plurality of treated ?-Si intrinsic layers.

Abstract: A method and apparatus for testing a photovoltaic substrate disposes the substrate on a support gantry with connection points such as vacuum cups. The gantry is actuated into a test position. A probe nest coupled to the gantry connects to a junction box on the substrate. A power supply applies voltage to the junction box, and an actuated frame contacts an edge region of the substrate to detect any breakthrough current. The actuated frame comprises a liner for maximizing contact with the edge of the substrate. The liner may be conductive, or may have a conductive surface. Current sensors coupled to the conductive liner of the frame detect any breakthrough current. A solar spectrum simulator provides solar spectrum radiation for testing the photovoltaic properties of the substrate.

Abstract: A method and apparatus for testing a photovoltaic substrate disposes the substrate on a support gantry with connection points such as vacuum cups. The gantry is actuated into a test position. A probe nest coupled to the gantry connects to a junction box on the substrate. A power supply applies voltage to the junction box, and an actuated frame contacts an edge region of the substrate to detect any breakthrough current. The actuated frame comprises a liner for maximizing contact with the edge of the substrate. The liner may be conductive, or may have a conductive surface. Current sensors coupled to the conductive liner of the frame detect any breakthrough current. A solar spectrum simulator provides solar spectrum radiation for testing the photovoltaic properties of the substrate.