Abstract: A distributed data processing system may include an interface that receives a data processing request from a requesting entity, a processing server to provide access to local data processing applications, a shadow processing server to provide access to remote data processing applications, and an application server to fulfill the received data processing request by selectively accessing local and remote data processing applications transparently to the requesting entity. Access to data may be facilitated by providing heterogeneous data sources with software wrappers that provide an object representation of the data source, providing outputs of software wrappers to a first accumulator that aggregates data to generate a first aggregate data representation, and using a second accumulator to generate a second aggregate data representation based on the first aggregate data representation from the first accumulator. The software wrappers may hide details (e.g., format, location) of the data source.

Abstract: A skew tester (60) measures output timing skew parameters OSHL and OSLH between multiple output signals of an integrated circuit (IC) device under test (DUT) having an input and multiple outputs. A measurement signal generating circuit (15,16,18,20) generates a square wave measurement signal at a test signal frequency synchronized with a clock signal. The measurement signal generating circuit uses direct digital synthesis to provide a specified phase shift resolution. A test signal generating circuit (15,22,24) generates a square wave test signal at the test signal frequency using the same clock signal. The test signal and measurement signal are therefore synchronized in frequency. The test signal is applied to the input of a DUT (25) and a switch (30) selects one of the DUT output signals.