Patents by Inventor Harry Yuheng Chou

Harry Yuheng Chou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEM AND METHOD FOR SELECTING COLONIES
    Publication number: 20220368863
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Application
    Filed: July 29, 2022
    Publication date: November 17, 2022
    Inventors: Strett Roger Nicolson, Mark Sakowski, Paul Fieni, Mark Larsen, Keri Lynne Jones Aman, Amy Alcott Llanso, Harry Yuheng Chou
  • System and method for selecting colonies
    Patent number: 11405592
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Grant
    Filed: November 2, 2017
    Date of Patent: August 2, 2022
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Strett Roger Nicolson, Mark Sakowski, Paul Fieni, Mark Larsen, Keri Lynne Jones Aman, Amy Alcott Llanso, Harry Yuheng Chou
  • SYSTEM AND METHOD FOR SELECTING COLONIES
    Publication number: 20190270959
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Application
    Filed: November 2, 2017
    Publication date: September 5, 2019
    Inventors: Strett Roger Nicolson, Mark Sakowski, Paul Fieni, Mark Larsen, Keri Lynne Jones Aman, Amy Alcott Llanso, Harry Yuheng Chou