Abstract: A measurement system of a device under test (DUT) includes a reference clock synthesizer configured to generate a master reference clock signal, a transmitter unit connected to the reference clock synthesizer and configured to connect to the DUT, and a measurement control system connected to the transmitter unit and configured to control the transmitter unit to generate a test signal pattern based on a first reference clock signal derived from the master reference clock signal, and generate a signal for passing through the DUT based on the test signal pattern. A receiver unit connected to the reference clock synthesizer is configured to connect to the DUT and to detect the signal and generate a digital signal based on the signal and a second reference clock signal derived from the master reference clock signal. The measurement control system is configured to provide an output signal based on the digital signal.

Abstract: A measurement system of a device under test (DUT) includes a reference clock synthesizer configured to generate a master reference clock signal, a transmitter unit connected to the reference clock synthesizer and configured to connect to the DUT, and a measurement control system connected to the transmitter unit and configured to control the transmitter unit to generate a test signal pattern based on a first reference clock signal derived from the master reference clock signal, and generate a signal for passing through the DUT based on the test signal pattern. A receiver unit connected to the reference clock synthesizer is configured to connect to the DUT and to detect the signal and generate a digital signal based on the signal and a second reference clock signal derived from the master reference clock signal. The measurement control system is configured to provide an output signal based on the digital signal.

Abstract: The invention provides a method and system for measuring a propagation delay of a device under test (DUT) using a first measurement unit and a second measurement unit. A first periodic signal transmitted from the first measurement unit via the DUT is received at the second measurement unit as a first delayed periodic signal. The first delayed periodic signal is then compared with a second periodic signal at the second measurement unit to generate the second comparison phase output. Similarly, the second periodic signal transmitted from the second measurement unit via the DUT is received at the first measurement unit as a second delayed periodic signal. The second delayed periodic signal is then compared with the first periodic signal at the first measurement unit to generate the first comparison phase output. Thereafter, the propagation delay is calculated by combining the first comparison phase output and the second comparison phase output.

Abstract: A mixed mode vector network analyzer (VNA) system to measure S-parameters and DC parameters of a differential device under test (DUT) is provided. The mixed mode VNA system measures mixed mode S-parameter measurements (i.e., AC measurements) using an independent resistive reflectometer bridge connected to each of the two ports of the differential DUT. The mixed mode VNA system further measures DC parameters of the differential DUT without impacting the measurement of S-parameters. In one embodiment, the mixed mode VNA system is used to measure multi-port differential DUT. Coupling capacitors provide low enough impedance to even the smallest RF frequency of AC measurement (i.e., measurement of S-parameters).

Abstract: The invention provides a method and system for measuring a propagation delay of a device under test (DUT) using a first measurement unit and a second measurement unit. A first periodic signal transmitted from the first measurement unit via the DUT is received at the second measurement unit as a first delayed periodic signal. The first delayed periodic signal is then compared with a second periodic signal at the second measurement unit to generate the second comparison phase output. Similarly, the second periodic signal transmitted from the second measurement unit via the DUT is received at the first measurement unit as a second delayed periodic signal. The second delayed periodic signal is then compared with the first periodic signal at the first measurement unit to generate the first comparison phase output. Thereafter, the propagation delay is calculated by combining the first comparison phase output and the second comparison phase output.

Abstract: A mixed mode vector network analyzer (VNA) system to measure S-parameters and DC parameters of a differential device under test (DUT) is provided. The mixed mode VNA system measures mixed mode S-parameter measurements (i.e., AC measurements) using an independent resistive reflectometer bridge connected to each of the two ports of the differential DUT. The mixed mode VNA system further measures DC parameters of the differential DUT without impacting the measurement of S-parameters. In one embodiment, the mixed mode VNA system is used to measure multi-port differential DUT. Coupling capacitors provide low enough impedance to even the smallest RF frequency of AC measurement (i.e., measurement of S-parameters).