Abstract: Functional faults of a turbo-machine are determined by operating the turbo-machine as a test object in a test stand using one or more gas pressure pulses which are not superimposed onto a substantially constant gas flow and detecting dynamic behavior of the test object using measuring devices, a measuring and control system and an evaluation unit.

Abstract: In the course of a method for the function testing of turbo-machines, preferably exhaust gas turbochargers (1, 2, 3), the test object is subjected to one or a plurality of gas pressure pulses and is operated thereby. For a simple, economic and still informative testing, the test object (1, 2, 3) is integrated in a testing device and, by means of this testing device, is subjected to at least one gas pressure pulse, preferably at least one compressed air pulse, wherein from the dynamic behavior of the test object (1, 2, 3) resulting therefrom, potential failures are determined.

Abstract: Performance Test Board for connecting at least one device under test (DUT) to a test system which has internal power supply sources (IPS) wherein said Performance Test Board (PTB) comprises at least one DC-DC-converter having an input terminal to which several internal power supply sources of said test system are connected in parallel, an output terminal to which a power supply terminal of said device under test (DUT) is connected and a control terminal to which a further internal power supply source of said test system is connected.

Abstract: Performance Test Board for connecting at least one device under test (DUT) to a test system which has internal power supply sources (IPS) wherein said Performance Test Board (PTB) comprises at least one DC-DC-converter having an input terminal to which several internal power supply sources of said test system are connected in parallel, an output terminal to which a power supply terminal of said device under test (DUT) is connected and a control terminal to which a further internal power supply source of said test system is connected.

Abstract: A test circuit for testing an integrated circuit, includes a test signal input for receiving a test signal from the integrated circuit and a reference signal input for receiving a reference signal. A comparator is in communication with the test signal input and with the reference signal input. The comparator is configured to provide, at a comparator output, an error signal if a comparison between the reference signal and the test signal indicates an error. The error signal, if present, is stored in an error memory, in communication with the comparator output.

Abstract: A test circuit for testing an integrated circuit, includes a test signal input for receiving a test signal from the integrated circuit and a reference signal input for receiving a reference signal. A comparator is in communication with the test signal input and with the reference signal input. The comparator is configured to provide, at a comparator output, an error signal if a comparison between the reference signal and the test signal indicates an error. The error signal, if present, is stored in an error memory, in communication with the comparator output.