Patents by Inventor Hartmut Spennemann

Hartmut Spennemann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120062879
    Abstract: A measuring instrument for determining the concentration of components in the body tissue by reflection spectroscopy is disclosed. In order, inter alia, to increase the functional reliability in the case of vibrations, the measuring instrument includes a diode laser with at least one laser diode and a waveguide structure, which has an external resonator, with a wavelength selective element, for each laser diode. In the process, the radiation generated by a laser diode is coupleable into the waveguide structure and the corresponding resonator and once again decoupleable from the resonator and the waveguide structure. Moreover, a corresponding method and a motor vehicle equipped therewith are disclosed.
    Type: Application
    Filed: September 15, 2011
    Publication date: March 15, 2012
    Applicant: Robert Bosch GmbH
    Inventors: Hartmut Spennemann, Ulrich Kallmann
  • Publication number: 20110127433
    Abstract: A device has a radiation device for radiating a terahertz signal onto the sample, a receiving device for receiving the terahertz signal reflected at the sample, a measuring device for measuring the intensity of the terahertz signal received and an analytical device for determining the moisture in the sample as a function of the measured intensity of the terahertz signal received.
    Type: Application
    Filed: November 3, 2010
    Publication date: June 2, 2011
    Inventors: Hartmut Spennemann, Ingo Ramsteiner, Michael Thiel, Sascha Steinkogler, Ulrich Ladstaetter
  • Publication number: 20090296099
    Abstract: An interferometric measuring device for measuring layer thicknesses of partially transparent layers on substrates, especially of wear protection layers based on carbon, having a scanning device which scans these layers automatically in its depth direction, using which an interference plane is displaceable relative to the layer structure, having an interferometer part that has a white light interferometer and/or a wavelength-scanning interferometer. Also described is a corresponding evaluation method.
    Type: Application
    Filed: August 2, 2006
    Publication date: December 3, 2009
    Inventors: Kurt Burger, Thomas Beck, Hartmut Spennemann, Stefan Grosse, Bernd Schmidtke, Ulrich Kallmann, Sebastian Jackisch
  • Publication number: 20090219515
    Abstract: An interferometric measuring device for measuring layer structure of a plurality of layers has: a scanning apparatus for displacing an interference plane relative to the layer structure; an interferometer part having a wavelength scanning interferometer; an image recorder recording the interfering radiation returning from a reference arm on an object arm, and producing electrical signals as output; and a downstream evaluation device for making available the measuring results.
    Type: Application
    Filed: September 4, 2006
    Publication date: September 3, 2009
    Inventors: Hartmut Spennemann, Bernd Schmidtke, Ulrich Kallmann, Sebastian Jackisch