Patents by Inventor Haruhiko Abe
Haruhiko Abe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11911850Abstract: A pillar delivery method is a method for delivering a plurality of pillars onto a substrate, including a glass panel, to manufacture a glass panel unit. The pillar delivery method includes an irradiation step, a holding step, and a mounting step. The irradiation step includes setting, over a holder, a sheet for use to form pillars and irradiating the sheet with a laser beam to punch out the plurality of pillars. The holding step includes having the plurality of pillars, which have been punched out of the sheet, held by the holder. The mounting step includes picking up some or all of the plurality of pillars from the holder and mounting the pillars onto the substrate.Type: GrantFiled: May 16, 2019Date of Patent: February 27, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Masataka Nonaka, Eiichi Uriu, Takeshi Shimizu, Kazuya Hasegawa, Tasuku Ishibashi, Hiroyuki Abe, Haruhiko Ishikawa
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Patent number: 11913277Abstract: A method for manufacturing a glass panel unit includes an assembling step, a bonding step, a gas exhausting step, a sealing step, and an activating step. The bonding step includes melting a peripheral wall in a baking furnace at a first predetermined temperature to hermetically bond a first glass pane and a second glass pane together with the peripheral wall thus melted. The gas exhausting step includes exhausting a gas from an internal space through an exhaust port in the baking furnace to turn the internal space into a vacuum space. The sealing step includes locally heating to a temperature higher than a second predetermined temperature, and thereby melting, either a port sealing material or an exhaust pipe to seal the exhaust port and thereby obtain a work in progress. The activating step includes activating a gas adsorbent after the sealing step to obtain a glass panel unit.Type: GrantFiled: June 19, 2019Date of Patent: February 27, 2024Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventors: Hiroyuki Abe, Eiichi Uriu, Kazuya Hasegawa, Tasuku Ishibashi, Masataka Nonaka, Takeshi Shimizu, Haruhiko Ishikawa
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Patent number: 8399807Abstract: The present invention provides a glow plug capable of preventing a deformation or eccentricity of the coil, thereby improving a durability of the coil and preventing a variation in temperature-rising characteristic. Also, the present invention provides a method for manufacturing the glow plug.Type: GrantFiled: February 19, 2008Date of Patent: March 19, 2013Assignee: NGK Spark Plug Co., Ltd.Inventor: Haruhiko Abe
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Publication number: 20100133252Abstract: The present invention provides a glow plug capable of preventing a deformation or eccentricity of the coil, thereby improving a durability of the coil and preventing a variation in temperature-rising characteristic. Also, the present invention provides a method for manufacturing the glow plug.Type: ApplicationFiled: February 19, 2008Publication date: June 3, 2010Inventor: Haruhiko Abe
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Patent number: 7640124Abstract: In a delay failure test circuit, a delay failure test between two clock domains among a plurality of clock domains having different operation clock rates is performed. The delay failure test circuit inputs, to a first clock domain, a clock signal having only a launch edge for transferring data from the first clock domain to a second clock domain, and to input, to the second clock domain, a clock signal having only a capture edge for capturing the data.Type: GrantFiled: March 14, 2007Date of Patent: December 29, 2009Assignee: Fujitsu Microelectronics LimitedInventors: Hideaki Konishi, Ryuji Shimizu, Masayasu Hojo, Haruhiko Abe, Satoshi Masuda, Naofumi Kobayashi
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Publication number: 20070288184Abstract: In a delay failure test circuit, a delay failure test between two clock domains among a plurality of clock domains having different operation clock rates is performed. The delay failure test circuit inputs, to a first clock domain, a clock signal having only a launch edge for transferring data from the first clock domain to a second clock domain, and to input, to the second clock domain, a clock signal having only a capture edge for capturing the data.Type: ApplicationFiled: March 14, 2007Publication date: December 13, 2007Applicant: FUJITSU LIMITEDInventors: Hideaki Konishi, Ryuji Shimizu, Masayasu Hojo, Haruhiko Abe, Satoshi Masuda, Naofumi Kobayashi
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Patent number: 4454166Abstract: A nitride film is formed on a main surface of a semiconductor substrate by plasma CVD process and an oxygen-containing layer is formed on the nitride film and an aluminum-containing film is further formed on the oxygen-containing layer.Type: GrantFiled: January 3, 1983Date of Patent: June 12, 1984Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Haruhiko Abe, Hiroshi Harada, Shigeji Kinoshita, Yoshihiro Hirata, Masahiko Denda, Yoichi Akasaka
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Patent number: 4438368Abstract: A plasma treating apparatus includes: an air-core coil for generating a static magnetic field which is axially uniform and a high-frequency waveguide for generating a high-frequency electromagnetic field which is irregular in the axial direction of the air-core coil. A plasma generating glass tube is disposed in the high-frequency waveguide and adapted to be supplied with a gas and a plasma reaction bath held under a vacuum for receiving the plasma flow which is generated axially in the glass tube. A substrate platform is disposed in the reaction bath for supporting a substrate to be treated at a right angle with respect to the plasma flow. There is also included a magnetic field generating coil disposed outside of said reaction bath for shaping the plasma.Type: GrantFiled: October 28, 1981Date of Patent: March 20, 1984Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Haruhiko Abe, Hiroshi Harada, Masahiko Denda, Koichi Nagasawa, Yoshio Kono
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Patent number: 4377734Abstract: Ions of a metal which becomes passive under the presence of oxygen with regard to plasma etching are implanted into selected portions of the surface of a workpiece, after which the workpiece is subjected to plasma etching with a reaction gas mixed with oxygen, whereby that layer which has been rendered passive acts as a mask, and an etched pattern is formed.Type: GrantFiled: October 9, 1980Date of Patent: March 22, 1983Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Yoji Mashiko, Hirozo Takano, Haruhiko Abe, Sotoju Asai, Kazuo Mizuguchi, Sumio Nomoto
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Patent number: 4341616Abstract: A dry etching device is provided in which on at least one portion of the path of etchant movement from the plasma production region to the etching workpiece a resin coating containing atoms or molecules of the same type as the chemically active atoms or molecules which constitute the etchant, is formed.Type: GrantFiled: December 11, 1980Date of Patent: July 27, 1982Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Masao Nagatomo, Haruhiko Abe, Kazuo Mizuguchi
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Patent number: 4333226Abstract: A thin film of a metal which is capable of oxidation and sublimation is formed on a major surface of a semiconductor substrate, and a portion of a major surface of the thin metallic film is irradiated with an oxygen ion beam to convert a portion of the thin metallic film to an oxide, and subsequently the thin metallic film is heat treated to remove the oxide by sublimation, whereby electrodes or wiring for a semiconductor integrated circuit are formed by the remaining thin metallic film.Type: GrantFiled: November 24, 1980Date of Patent: June 8, 1982Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Haruhiko Abe, Masao Nagatomo, Natsuro Tsubouchi, Hiroshi Harada, Junichi Mitsuhashi
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Patent number: 4314874Abstract: A thin aluminum film 3 is formed on the top surface of a substrate 2, 1. Selected areas of the aluminum film are irradiated by an oxygen ion beam 6 to form implanted regions 7. The surface is then plasma etched, with the oxygen ion implanted regions serving as a mask to thereby prevent the removal of the underlying areas of the aluminum film.Type: GrantFiled: September 24, 1980Date of Patent: February 9, 1982Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Haruhiko Abe, Yoji Mashiko, Hiroshi Harada, Sotoju Asai, Kazuo Mizuguchi, Sumio Nomoto