Patents by Inventor Haruko Ohno

Haruko Ohno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6776919
    Abstract: There is provided a method and apparatus for etching a ruthenium film which can sufficiently etch away a ruthenium film formed on or adhering to the peripheral region, especially a no-device-formed region, backside or other portions of a substrate. The method comprises etching a ruthenium film formed on a substrate with a chemical liquid having a pH of not less than 12 and an oxidation-reduction potential of not less than 300 mVvsSHE.
    Type: Grant
    Filed: November 20, 2001
    Date of Patent: August 17, 2004
    Assignee: Ebara Corporation
    Inventors: Akira Fukunaga, Haruko Ohno, Ichiro Katakabe, Sachiko Kihara
  • Patent number: 6745784
    Abstract: An apparatus continuously supplies an acid solution to a central portion of a surface of a substrate while the substrate is rotating, and also supplies an oxidizing agent solution continuously or intermittently to a periphery of the substrate. In addition, the apparatus supplies an oxidizing agent solution and an acid solution either simultaneously or alternately to a reverse side of the substrate.
    Type: Grant
    Filed: March 19, 2003
    Date of Patent: June 8, 2004
    Assignee: Ebara Corporation
    Inventors: Ichiro Katakabe, Shinya Morisawa, Haruko Ohno, Sachiko Kihara, Akira Fukunaga
  • Publication number: 20030168089
    Abstract: An apparatus continuously supplies an acid solution to a central portion of a surface of a substrate while the substrate is rotating, and also supplies an oxidizing agent solution continuously or intermittently to a periphery of the substrate. In addition, the apparatus supplies an oxidizing agent solution and an acid solution either simultaneously or alternately to a reverse side of the substrate.
    Type: Application
    Filed: March 19, 2003
    Publication date: September 11, 2003
    Inventors: Ichiro Katakabe, Shinya Morisawa, Haruko Ohno, Sachiko Kihara, Akira Fukunaga
  • Publication number: 20030092264
    Abstract: There is provided a substrate processing apparatus and method which can uniformly increase the rate of processing of a substrate, e.g. etching or plating that takes place in the surface of a substrate, and which, when carrying out plating processing of a substrate, can form a plated film having a uniform film thickness easily and quickly. The substrate processing apparatus includes: a substrate holder 10 for holding and rotating a substrate W; and a heated fluid supply section 24 for bringing a heated fluid at a controlled temperature into contact with the substrate W, which is held and rotated by the substrate holder 10, so as to control the temperature of the substrate W.
    Type: Application
    Filed: October 2, 2002
    Publication date: May 15, 2003
    Inventors: Shinji Kajita, Ichiro Katakabe, Haruko Ohno, Yuki Inoue, Sachiko Kihara
  • Patent number: 6558478
    Abstract: An acid solution is continuously supplied to a central portion of a surface of a substrate while the substrate is rotating, and an oxidizing agent solution is continuously or intermittently supplied to a periphery of the substrate. In addition, an oxidizing agent solution and an acid solution are simultaneously or alternately supplied to a reverse side of the substrate.
    Type: Grant
    Filed: October 6, 2000
    Date of Patent: May 6, 2003
    Assignee: Ebara Corporation
    Inventors: Ichiro Katakabe, Shinya Morisawa, Haruko Ohno, Sachiko Kihara, Akira Fukunaga
  • Publication number: 20020060202
    Abstract: There is provided a method and apparatus for etching a ruthenium film which can sufficiently etch away a ruthenium film formed on or adhering to the peripheral region, especially the no device formed region, backside or other portions of a substrate. The method comprises etching a ruthenium film formed on a substrate with a chemical liquid having a pH of not less than 12 or and an oxidation-reduction potential of not less than 300 mVvsSHE.
    Type: Application
    Filed: November 20, 2001
    Publication date: May 23, 2002
    Inventors: Akira Fukunaga, Haruko Ohno, Ichiro Katakabe, Sachiko Kihara