Patents by Inventor Harumi Maruyama
Harumi Maruyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8324568Abstract: A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.Type: GrantFiled: June 4, 2010Date of Patent: December 4, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama
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Patent number: 8309917Abstract: The present invention maintains a stable emission amount from an emitter. In an embodiment of the present invention, a solid sample or a liquid sample is heated to gasify an object to be measured contained in the solid sample or the liquid sample, thereby forming a neutral gaseous molecule, and a metal ion emitted from an emitter having an oxidized surface is attached to the neutral gaseous molecule to ionize the neutral gaseous molecule, which is subjected to mass spectrometry. The solid sample or the liquid sample is a sample that emits a reducing gas by heating. The heating for gasifying the object to be measured is performed at a temperature lower than the vaporization temperature of the solid sample or the liquid sample and not less than the vaporization temperature of the object to be measured, and an oxidizing gas is provided to the emitter.Type: GrantFiled: December 7, 2009Date of Patent: November 13, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Harumi Maruyama, Yasuyuki Taneda, Megumi Nakamura
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Patent number: 8164051Abstract: An internal standard material to be added to a specimen containing a material to be measured when measuring the content of the material to be measured by performing mass spectrometry on the specimen includes a hindered phenol compound.Type: GrantFiled: April 14, 2009Date of Patent: April 24, 2012Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 8049166Abstract: A mass spectrometer system comprises a chamber having an ion emitting unit to emit metal ions in the chamber with a communicating hole; a neutral molecule introduction unit; another gas introduction unit; a controller controlling a temperature of a region where metal ions attach to the neutral molecules; and a mass analyzer for the neutral molecules with the metal ions, wherein plotting an attachment energy of the metal ions attached to the neutral molecules in the chamber along an abscissa and the temperature of the region where the metal ions attach to the neutral molecules along an ordinate, the controller adjusts the temperature of the region so as to fall within a range obtained by excluding a range corresponding to the temperature of the region from 150 to 200° C. from a range surrounded by the temperatures of the region [° C.]=150×attachment energy [eV], 100×attachment energy [eV]?50, and 20° C., and attachment energies [eV]=2.1 and 0.5.Type: GrantFiled: December 23, 2009Date of Patent: November 1, 2011Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama
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Patent number: 7952069Abstract: A mass spectrometer includes an ionization chamber, a temperature control unit which controls the temperature in the ionization chamber to vaporize a sample in at least one of solid and liquid state in the ionization chamber, an introduction unit which introduces the sample into the ionization chamber, an ion supply unit which supplies ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber, and a mass analyzer which measures the mass of the molecules of the ionized sample.Type: GrantFiled: April 28, 2009Date of Patent: May 31, 2011Assignee: Canon Anelva CorporationInventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama, Aiko Wada
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Publication number: 20100243884Abstract: A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.Type: ApplicationFiled: June 4, 2010Publication date: September 30, 2010Applicant: CANON ANELVA CORPORATIONInventors: Yoshiro Shiokawa, Yoshiki Hirano, Megumi Nakamura, Yasuyuki Taneda, Qiang Peng, Harumi Maruyama
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Publication number: 20100163723Abstract: A mass spectrometer system comprises a chamber having an ion emitting unit to emit metal ions in the chamber with a communicating hole; a neutral molecule introduction unit; another gas introduction unit; a controller controlling a temperature of a region where metal ions attach to the neutral molecules; and a mass analyzer for the neutral molecules with the metal ions, wherein plotting an attachment energy of the metal ions attached to the neutral molecules in the chamber along an abscissa and the temperature of the region where the metal ions attach to the neutral molecules along an ordinate, the controller adjusts the temperature of the region so as to fall within a range obtained by excluding a range corresponding to the temperature of the region from 150 to 200° C. from a range surrounded by the temperatures of the region [° C.]=150×attachment energy [eV], 100×attachment energy [eV]?50, and 20° C., and attachment energies [eV]=2.1 and 0.5.Type: ApplicationFiled: December 23, 2009Publication date: July 1, 2010Applicant: CANON ANELVA TECHNIX CORPORATIONInventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama
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Publication number: 20100163722Abstract: The present invention maintains a stable emission amount from an emitter. In an embodiment of the present invention, a solid sample or a liquid sample is heated to gasify an object to be measured contained in the solid sample or the liquid sample, thereby forming a neutral gaseous molecule, and a metal ion emitted from an emitter having an oxidized surface is attached to the neutral gaseous molecule to ionize the neutral gaseous molecule, which is subjected to mass spectrometry. The solid sample or the liquid sample is a sample that emits a reducing gas by heating. The heating for gasifying the object to be measured is performed at a temperature lower than the vaporization temperature of the solid sample or the liquid sample and not less than the vaporization temperature of the object to be measured, and an oxidizing gas is provided to the emitter.Type: ApplicationFiled: December 7, 2009Publication date: July 1, 2010Applicant: CANON ANELVA TECHNIX CORPORATIONInventors: Yoshiro Shiokawa, Harumi Maruyama, Yasuyuki Taneda, Megumi Nakamura
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Publication number: 20090272894Abstract: A mass spectrometer includes an ionization chamber, a temperature control unit which controls the temperature in the ionization chamber to vaporize a sample in at least one of solid and liquid state in the ionization chamber, an introduction unit which introduces the sample into the ionization chamber, an ion supply unit which supplies ions to the ionization chamber to ionize, in the ionization chamber, the sample vaporized in the ionization chamber, and a mass analyzer which measures the mass of the molecules of the ionized sample.Type: ApplicationFiled: April 28, 2009Publication date: November 5, 2009Applicant: CANON ANELVA TECHNIX CORPORATIONInventors: Yoshiro Shiokawa, Megumi Nakamura, Harumi Maruyama, Aiko Wada
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Publication number: 20090266981Abstract: An internal standard material to be added to a specimen containing a material to be measured when measuring the content of the material to be measured by performing mass spectrometry on the specimen includes a hindered phenol compound.Type: ApplicationFiled: April 14, 2009Publication date: October 29, 2009Applicant: Canon Anelva Technix CorporationInventors: Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 7202474Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: GrantFiled: March 22, 2006Date of Patent: April 10, 2007Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Publication number: 20060169888Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: ApplicationFiled: March 22, 2006Publication date: August 3, 2006Applicant: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 7084397Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: GrantFiled: March 31, 2004Date of Patent: August 1, 2006Assignee: Anelva CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Publication number: 20040251408Abstract: An ion attachment mass spectrometry apparatus causing positively charged metal ions to attach to molecules of a gas to be measured in an attachment region to generate attached ions and then performing mass spectrometry on the attached ions by a mass spectrometer, has a metal ion selective disassociation unit for selectively making the metal ions attached to the specific molecules in the attachment region disassociate. By making the metal ions attached to the specific molecules such as H2O disassociate, a state is formed where the metal ions are attached to only the sample gas to be measured and the reliability of measurement of the gas is improved.Type: ApplicationFiled: March 31, 2004Publication date: December 16, 2004Applicant: ANELVA CorporationInventors: Yoshiki Hirano, Yoshiro Shiokawa, Harumi Maruyama, Megumi Nakamura
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Patent number: 5375448Abstract: A non-interference control method and device in which an object to be controlled, which is controlled by a plurality of operation quantities and at least one control quantity, is divided into a plurality of partial control systems so that each of the partial control systems has at least one operation quantity and at least one partial control system has more than two operation or control quantities, wherein to the operation quantity in one partial control system is added a compensating element which annuls influences exerted by other partial control systems on said one partial control system, said object to be controlled being controlled on the basis of the relevant compensated operation quantity.Type: GrantFiled: March 1, 1993Date of Patent: December 27, 1994Assignee: Hitachi, Ltd.Inventors: Yasunori Katayama, Yasuo Morooka, Taiko Takano, Harumi Maruyama, Itsuo Shimizu, Satoshi Hattori, Yutaka Saito