Abstract: A glass-ceramic includes an oxide containing lithium (Li), silicon (Si), and boron (B) and has an X-ray diffraction spectrum with two or more peaks appearing in the range 20°?2??25° and with two or more peaks appearing in the range 25°<2??30°.

Abstract: A glass-ceramic includes an oxide containing lithium (Li), silicon (Si), and boron (B) and has an X-ray diffraction spectrum with two or more peaks appearing in the range 20°?2??25° and with two or more peaks appearing in the range 25°<2??30°.

Abstract: A battery is provided including a positive electrode, a negative electrode, and an electrolyte layer between the positive electrode and the negative electrode. At least one of the positive electrode and the negative electrode includes at least one kind of an inorganic binder that includes an oxide of at least one kind of element selected from the group including bismuth (Bi), zinc (Zn), boron (B), silicon (Si) and vanadium (V).

Abstract: An electrode includes carbon black, a fibrous carbon material and an organic binder. The carbon black (A) and the fibrous carbon material (B) are in a mass ratio (B/A) within the range of from 10/90 to 50/50.

Abstract: An object of the present invention is to provide a spectroscopic method and an apparatus which can measure a trace element accurately with high sensitivity. In order to achieve this object, for example, in Fourier transformation infrared spectroscopy (FT-IR), a reference spectrum and a measurement spectrum including an impurity spectrum are measured in order to obtain a differential spectrum comprising the impurity spectrum and a flat baseline, correction including a frequency shift of the reference spectrum before calculating a differential spectrum, is performed on the reference spectrum. This makes it possible to remove baseline deformation due to phonon absorbance of silicon included in the conventional differential spectrum, and to obtain an infrared absorption spectrum of the substitutional carbon with high accuracy and high sensitivity.

Abstract: An object of the present invention is to provide a spectroscopic method and an apparatus which can measure a trace element accurately with high sensitivity. In order to achieve this object, for example, in Fourier transformation infrared spectroscopy (FT-IR), a reference spectrum and a measurement spectrum including an impurity spectrum are measured in order to obtain a differential spectrum comprising the impurity spectrum and a flat baseline, correction including a frequency shift of the reference spectrum before calculating a differential spectrum, is performed on the reference spectrum. This makes it possible to remove baseline deformation due to phonon absorbance of silicon included in the conventional differential spectrum, and to obtain an infrared absorption spectrum of the substitutional carbon with high accuracy and high sensitivity.

Abstract: There is described an instrument capable of immediately and accurately extracting contaminants from solely either side of a wafer surface or from a certain area on the wafer surface. O-rings, each of which is partially cut, are attached to respective sides of wafer holding members. A wafer is held from respective sides by the wafer holding members. Extraction of contaminants from the upper surface of the wafer is carried out independently of extraction of contaminants from the underside of the wafer, by means of feeding extraction solvent to the interior spaces defined by the respective O-rings. Thereby, quick and appropriate extraction of contaminants from either side of a wafer.