Patents by Inventor Haruo Iwatsu

Haruo Iwatsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10428438
    Abstract: A substrate processing method of performing a predetermined processing by supplying a processing liquid to a processing region of a substrate and using processing target ions in the processing liquid, includes: arranging a template to face the substrate, the template including a passage configured to distribute the processing liquid, a direct electrode, and an indirect electrode, and the substrate including a counter electrode, which matches with the direct electrode, installed in the processing region; supplying the processing liquid to the processing region through the passage; and performing the predetermined processing on the substrate by applying a voltage to the indirect electrode to cause the processing target ions to migrate to the counter electrode side while applying a voltage between the direct electrode and the counter electrode to oxidize or reduce the processing target ions that have migrated to the counter electrode side.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: October 1, 2019
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Haruo Iwatsu, Tomohisa Hoshino, Toshiyuki Matsumoto
  • Patent number: 10294575
    Abstract: An electrolytic treatment device that performs a prescribed treatment using ions to be treated that are contained in a treatment liquid, and includes a direct electrode and a counter electrode which are arranged on either side of the treatment liquid, an indirect electrode which forms an electric field in the treatment liquid, and a switch which switches between connection of the indirect electrode to the power source and connection of the indirect electrode to the direct electrode or the counter electrode. The switch connects and applies a voltage across the indirect electrode and the power source, and breaks the connection between the indirect electrode and the power source and connects the indirect electrode to the direct electrode or the counter electrode.
    Type: Grant
    Filed: December 12, 2014
    Date of Patent: May 21, 2019
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Haruo Iwatsu
  • Patent number: 10036095
    Abstract: An electrolytic treatment method in which a predetermined treatment is performed using treatment subject ions contained in a treatment liquid, the method including: an electrode positioning step for positioning a direct electrode and a counter electrode so as to sandwich the treatment liquid, and positioning an indirect electrode for forming an electric field in the treatment liquid; a treatment subject ion migration step for applying a voltage to the indirect electrode and thereby moving the treatment subject ions in the treatment liquid to the counter electrode side; and a treatment subject ion redox step for applying a voltage between the direct electrode and the counter electrode and thereby oxidizing or reducing the treatment subject ions which have migrated to the counter electrode side.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: July 31, 2018
    Assignees: TOKYO ELECTRON LIMITED, NATIONAL UNIVERSITY CORPORATION KUMAMOTO UNIVERSITY
    Inventors: Haruo Iwatsu, Hidenori Akiyama
  • Publication number: 20160326663
    Abstract: An electrolytic treatment device that performs a prescribed treatment using ions to be treated that are contained in a treatment liquid, and includes a direct electrode and a counter electrode which are arranged on either side of the treatment liquid, an indirect electrode which forms an electric field in the treatment liquid, and a switch which switches between connection of the indirect electrode to the power source and connection of the indirect electrode to the direct electrode or the counter electrode. The switch connects and applies a voltage across the indirect electrode and the power source, and breaks the connection between the indirect electrode and the power source and connects the indirect electrode to the direct electrode or the counter electrode.
    Type: Application
    Filed: December 12, 2014
    Publication date: November 10, 2016
    Applicant: TOKYO ELECTRON LIMITED
    Inventor: Haruo IWATSU
  • Publication number: 20160108538
    Abstract: A substrate processing method of performing a predetermined processing by supplying a processing liquid to a processing region of a substrate and using processing target ions in the processing liquid, includes: arranging a template to face the substrate, the template including a passage configured to distribute the processing liquid, a direct electrode, and an indirect electrode, and the substrate including a counter electrode, which matches with the direct electrode, installed in the processing region; supplying the processing liquid to the processing region through the passage; and performing the predetermined processing on the substrate by applying a voltage to the indirect electrode to cause the processing target ions to migrate to the counter electrode side while applying a voltage between the direct electrode and the counter electrode to oxidize or reduce the processing target ions that have migrated to the counter electrode side.
    Type: Application
    Filed: May 12, 2014
    Publication date: April 21, 2016
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Haruo IWATSU, Tomohisa HOSHINO, Toshiyuki MATSUMOTO
  • Publication number: 20160083856
    Abstract: An electrolytic treatment method in which a predetermined treatment is performed using treatment subject ions contained in a treatment liquid, the method including: an electrode positioning step for positioning a direct electrode and a counter electrode so as to sandwich the treatment liquid, and positioning an indirect electrode for forming an electric field in the treatment liquid; a treatment subject ion migration step for applying a voltage to the indirect electrode and thereby moving the treatment subject ions in the treatment liquid to the counter electrode side; and a treatment subject ion redox step for applying a voltage between the direct electrode and the counter electrode and thereby oxidizing or reducing the treatment subject ions which have migrated to the counter electrode side.
    Type: Application
    Filed: May 12, 2014
    Publication date: March 24, 2016
    Applicants: TOKYO ELECTRON LIMITED, National University Corporation Kumamoto University
    Inventors: Haruo IWATSU, Hidenori AKIYAMA
  • Publication number: 20150303105
    Abstract: Disclosed is a method for manufacturing a semiconductor device. The method includes a template disposing step, a processing solution supply step, and a processing step. At the processing step, a template including a plurality of flow paths configured to allow a processing solution to flow therethrough and a plurality of electrodes installed in the flow paths is disposed with respect to a substrate including a plurality of through holes formed therethrough in a thickness direction such that the flow paths correspond to the through holes. At the processing solution supply step, the processing solution is supplied into the through holes through the flow paths, and at the processing step, a predetermined processing is performed with respect to the substrate by applying a voltage using one of the electrodes as a positive electrode and using another electrode as a negative electrode.
    Type: Application
    Filed: November 28, 2013
    Publication date: October 22, 2015
    Inventors: Haruo IWATSU, Toshiyuki MATSUMOTO
  • Patent number: 9087771
    Abstract: A method for manufacturing a semiconductor device includes: forming a structure including a substrate, a device layer formed on the substrate, a pair of through-hole electrodes penetrating through the substrate in the thickness direction of the substrate, a pair of vertical electrodes extending in the thickness direction of the substrate and reaching to one surface of the substrate, and a shared wiring connecting the pair of vertical electrodes in the device layer; forming a connection wiring connecting one of the through-hole electrodes and one of the vertical electrodes; and stacking the structure and a second substrate such that an electrode of the second substrate is connected to a through-hole electrode which is not connected to the connection wiring among the pair of through-hole electrodes.
    Type: Grant
    Filed: February 10, 2014
    Date of Patent: July 21, 2015
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Haruo Iwatsu, Toshiyuki Matsumoto
  • Publication number: 20150108001
    Abstract: Disclosed is a liquid processing jig for performing a predetermined processing on a workpiece using a processing liquid. The liquid processing jig includes: a liquid processing unit formed on a surface of the liquid processing jig and configured to perform a predetermined processing on the workpiece by the processing liquid; a liquid supplying unit configured to supply the processing liquid to the liquid processing unit; a liquid supplying channel configured to connect the liquid supplying unit and the liquid processing unit and supply the processing liquid from the liquid supplying unit to the liquid processing unit; and a liquid discharging channel configured to discharge the processing liquid from the liquid processing unit. The liquid supplying unit, the liquid supplying channel, the liquid processing unit, and the liquid discharging channel are provided to cause the processing liquid to flow by a capillary phenomenon.
    Type: Application
    Filed: October 21, 2014
    Publication date: April 23, 2015
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Kazuo SAKAMOTO, Haruo IWATSU
  • Publication number: 20140311530
    Abstract: A substrate processing method of performing a predetermined processing by supplying a processing liquid to a processing region on a surface of a substrate, includes: supplying an alignment liquid to an alignment region on the surface of the substrate formed at a position different from that of the processing region; aligning a template disposed facing the substrate and including a processing liquid passage configured to pass the processing liquid and an alignment liquid passage configured to pass the alignment liquid, with respect to the substrate with the alignment liquid supplied to the alignment region such that the processing liquid passage is positioned above the processing region; and performing the predetermined processing on the substrate by supplying the processing liquid to the processing region through the processing liquid passage.
    Type: Application
    Filed: October 22, 2012
    Publication date: October 23, 2014
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Haruo Iwatsu, Takayuki Toshima, Kazuo Sakamoto
  • Publication number: 20140151901
    Abstract: A method for manufacturing a semiconductor device includes: forming a structure including a substrate, a device layer formed on the substrate, a pair of through-hole electrodes penetrating through the substrate in the thickness direction of the substrate, a pair of vertical electrodes extending in the thickness direction of the substrate and reaching to one surface of the substrate, and a shared wiring connecting the pair of vertical electrodes in the device layer; forming a connection wiring connecting one of the through-hole electrodes and one of the vertical electrodes; and stacking the structure and a second substrate such that an electrode of the second substrate is connected to a through-hole electrode which is not connected to the connection wiring among the pair of through-hole electrodes.
    Type: Application
    Filed: February 10, 2014
    Publication date: June 5, 2014
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Haruo IWATSU, Toshiyuki Matsumoto
  • Patent number: 8664106
    Abstract: A method of manufacturing a semiconductor device, wherein a first substrate where first electrode pads are formed and a second substrate where second electrode pads are formed are stacked and the first electrode pads and the corresponding second electrode pads are electrically connected thereby forming the semiconductor device is disclosed. The method includes steps of performing a first hydrophilic treatment with respect to the first electrode pads; supplying liquid to a surface where the first electrode pads are formed in the first substrate; and placing the second substrate on the first substrate to which the liquid is supplied so that the surface where the first electrode pads are formed opposes a surface where the second electrode pads are formed, thereby aligning the first electrode pads and the second electrode pads by the liquid that gathers in the first electrode pads that have been subject to the first hydrophilic treatment.
    Type: Grant
    Filed: September 7, 2010
    Date of Patent: March 4, 2014
    Assignee: Tokyo Electron Limited
    Inventor: Haruo Iwatsu
  • Publication number: 20140043051
    Abstract: An inspection apparatus for inspecting target objects includes multiple inspection cells corresponding to target objects, respectively, and a test-pattern wiring formed between the inspection cells. Each of the inspection cell includes a test pattern memory device which temporarily stores a test pattern, an inspection signal driver device which transmits an inspection signal to a respective one of the target objects based on the test pattern, a comparator device which compares an output signal from the respective one of the target objects with an expected value corresponding to the test pattern such that a test result is obtained, and a test result memory device which temporarily stores the test result, and the test-pattern wiring transmits the test pattern to the test pattern memory device of each of the inspection cells from an upstream side to a downstream side in the order that the target objects are inspected.
    Type: Application
    Filed: October 11, 2013
    Publication date: February 13, 2014
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Haruo IWATSU, Yoshinori FUJISAWA
  • Publication number: 20120169365
    Abstract: A substrate inspecting apparatus includes an inspecting apparatus main body for electrically inspecting a substrate on which an electronic circuit and electrode pads are formed, and a contactor electrically connected to the inspecting apparatus main body. The contactor includes contact portions made of conductive material. In the substrate inspecting apparatus, the contact portions are electrically connected to the electrode pads of the substrate via conductive liquid to inspect the electronic circuit formed on the substrate.
    Type: Application
    Filed: September 9, 2010
    Publication date: July 5, 2012
    Applicant: Tokyo Electron Limited
    Inventor: Haruo Iwatsu
  • Publication number: 20120171858
    Abstract: A method of manufacturing a semiconductor device, wherein a first substrate where first electrode pads are formed and a second substrate where second electrode pads are formed are stacked and the first electrode pads and the corresponding second electrode pads are electrically connected thereby forming the semiconductor device is disclosed. The method includes steps of performing a first hydrophilic treatment with respect to the first electrode pads; supplying liquid to a surface where the first electrode pads are formed in the first substrate; and placing the second substrate on the first substrate to which the liquid is supplied so that the surface where the first electrode pads are formed opposes a surface where the second electrode pads are formed, thereby aligning the first electrode pads and the second electrode pads by the liquid that gathers in the first electrode pads that have been subject to the first hydrophilic treatment.
    Type: Application
    Filed: September 7, 2010
    Publication date: July 5, 2012
    Applicant: Tokyo Electron Limited
    Inventor: Haruo Iwatsu
  • Patent number: 6268900
    Abstract: When a glass substrate is conveyed from a processing device group side to an accommodating apparatus, the glass substrate is accommodated to a first accommodating portion corresponding to the layer formed on the glass substrate. When a predetermined number of glass substrates have been accommodated to each accommodating portion, glass substrats accommodated in each accommodating portion corresponding to the layer of the glass substrates are conveyed to an exposing device side. After the exposing device has performed an exposing process for glass substrates, they are successively accommodated to the relevant accommodating portion. In the order of which glass substrates have been conveyed from the processing device group side to the accommodating apparatus, the glass substrates are returned to the processing device side.
    Type: Grant
    Filed: September 28, 1999
    Date of Patent: July 31, 2001
    Assignee: Tokyo Electron Limited
    Inventor: Haruo Iwatsu
  • Patent number: 5312487
    Abstract: A coating apparatus includes a rotating and holding mechanism which holds and rotates an object to be coated, a container which encloses the rotating and holding mechanism and prevents the dispersion of coating liquid supplied to the object, a washing fitting provided to the rotating and holding mechanism and which supplies washing liquid for washing off coating liquid which has attached to the inside of container. This washing fitting has a collection pool for collecting the washing liquid, and discharge holes through which the washing liquid in the collection pool is discharged by rotation of the rotating and holding mechanism. Thus, it is possible to evenly wash off coating liquid which has attached to the inside of the container in a short time with a small amount of washing liquid.
    Type: Grant
    Filed: September 18, 1992
    Date of Patent: May 17, 1994
    Assignees: Tokyo Electron Kabushiki Kaisha, Tokyo Electron Kyushu Kabushiki Kaisha
    Inventors: Masami Akimoto, Akihiro Fujimoto, Haruo Iwatsu
  • Patent number: 5127362
    Abstract: A liquid coating device for coating a solution on a substrate to form a film includes a chuck for rotatably supporting the substrate, a nozzle for supplying the solution on the substrate, a heater provided in the nozzle for changing a temperature of the solution, a sensor for measuring a temperature of an ambient atmosphere of the substrate, and a controller for controlling the heater according the measured temperature. Thus, a solution having a temperature corresponding to the temperature of the ambient atmosphere is supplied from the nozzle to the substrate.
    Type: Grant
    Filed: May 21, 1990
    Date of Patent: July 7, 1992
    Assignees: Tokyo Electron Limited, Tokyo Electron Kyushu Limited
    Inventors: Haruo Iwatsu, Yasuhiro Sakamoto, Junro Iwakiri