Patents by Inventor Haruo Umeki

Haruo Umeki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manufacturing instruction evaluation support system, manufacturing instruction evaluation support method, and manufacturing instruction evaluation support program
    Patent number: 8000819
    Abstract: A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference
    Type: Grant
    Filed: February 25, 2009
    Date of Patent: August 16, 2011
    Assignee: Hitachi, Ltd.
    Inventors: Shinichirou Hanawa, Isao Nakamura, Akiko Tadokoro, Atsunori Hotehama, Yukiko Yamamoto, Haruo Umeki, Akihiro Kondo, Youichi Hamamoto, Kouichi Hiraoka
  • MANUFACTURING INSTRUCTION EVALUATION SUPPORT SYSTEM, MANUFACTURING INSTRUCTION EVALUATION SUPPORT METHOD, AND MANUFACTURING INSTRUCTION EVALUATION SUPPORT PROGRAM
    Publication number: 20090292384
    Abstract: A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference
    Type: Application
    Filed: February 25, 2009
    Publication date: November 26, 2009
    Inventors: Shinichirou Hanawa, Isao Nakamura, Akiko Tadokoro, Atsunori Hotehama, Yukiko Yamamoto, Haruo Umeki, Akihiro Kondo, Youichi Hamamoto, Kouichi Hiraoka