Abstract: A wavelength measuring device includes: light receiving elements that receive light to be measured; a temperature controller that maintains the light receiving elements at different temperatures from one another; and a calculation unit that determines the wavelength of the light to be measured, based on outputs of the light receiving elements.

Abstract: An optical axis adjusting method for adjusting a tilt angle of an optical axis in two regions optically coupled in a holding member includes the steps of: roughly adjusting the optical axis by irradiating a first region on the holding member with a laser beam; and finely adjusting the optical axis by irradiating a second region on the holding member with a laser beam. One of the two regions is set as a reference point. The first region is located closer to the reference point, while the second region is located further from the reference point.

Abstract: A wavelength measuring device includes: a light receiving element that receive light to be measured; a temperature controller that maintains the light receiving element at different temperatures; and a calculation unit that determines the wavelength of the light to be measured, based on the outputs of the light receiving elements.

Abstract: An optical axis adjusting method for adjusting a tilt angle of an optical axis in two regions optically coupled in a holding member includes the steps of: roughly adjusting the optical axis by irradiating a first region on the holding member with a laser beam; and finely adjusting the optical axis by irradiating a second region on the holding member with a laser beam. One of the two regions is set as a reference point. The first region is located closer to the reference point, while the second region is located further from the reference point.

Abstract: A testing system includes: a plurality of test applying portions that operate a test device to make an output signal from the test device; a plurality of testing portions that test the output of the test device; and a switch portion that switches the output signal between the test applying portions and the testing portions. The testing portions each have a test information portion that outputs test item information which includes a test capability of the testing portion, and have a test performing portion that receives the output signal from the test applying portion which is selected under the test item information through the switch portion, and performs a test under a designated test item.

Abstract: A testing system includes: a plurality of test applying portions that operate a test device to make an output signal from the test device; a plurality of testing portions that test the output of the test device; and a test applying portion having a test device to output a tested signal; and a switch portion that switches the output signal between the test applying portions and the testing portions. The switch portion includes: (1) a first switch having an input port and a plurality of output ports, and selects the output port for connecting the input port; (2) a second switch having a plurality of input ports and an output port, and selects the input port for connecting the output port; and (3) a connecting portion that has a plurality of transmission parts that connect the output ports of the first switch and the input ports of the second switch.

Abstract: A testing system includes: a plurality of test applying portion that operate a test device to make an output signal from the test device; a plurality of testing portions that test the output of the test device; and a switch portion that switches the output signal between the test applying portions and the testing portions. The test applying portion has a selecting portion that selects the testing portion for testing the output signal through the switch portion under test item information, the test item information including information about a test capability of the testing portion.

Abstract: A laser module includes a semiconductor laser, an output optical system provided on an optical output side of the semiconductor laser, a temperature detecting element that detects a temperature of the output optical system; and an output controller that calculates a drive current to set an optical output intensity of the laser module at a desired value on the basis of temperature information obtained by the temperature detecting element, and outputs the drive current to the semiconductor laser.

Abstract: An optical axis adjusting method for adjusting a tilt angle of an optical axis in two regions optically coupled in a holding member includes the steps of: roughly adjusting the optical axis by irradiating a first region on the holding member with a laser beam; and finely adjusting the optical axis by irradiating a second region on the holding member with a laser beam. One of the two regions is set as a reference point. The first region is located closer to the reference point, while the second region is located further from the reference point.

Abstract: A wavelength measuring device includes: light receiving elements that receive light to be measured; a temperature controller that maintains the light receiving elements at different temperatures from one another; and a calculation unit that determines the wavelength of the light to be measured, based on outputs of the light receiving elements.

Abstract: In the semiconductor laser module testing device, a temperature control power source changes a temperature of a wavelength locker module, and a wavelength monitoring bias circuit detects an output of a wavelength monitor in the changed temperature range and computes a correlation between a temperature of a semiconductor laser and a wavelength of light output therefrom. Moreover, the wavelength of the output light is locked by controlling the temperature of the wavelength locker module while feeding back the output of the wavelength monitor by a wavelength feedback circuit based on the obtained correlation between the temperature and the wavelength.

Abstract: In order to tune an oscillation wavelength of a semiconductor laser diode to a target wavelength, the amount of change of a wavelength to the amount of change of a wavelength varying item is determined by actual measurement and a basic wavelength coefficient is renewed by using the ratio of both amounts of change as a corrective wavelength coefficient, and thus the characteristic when the wavelength of an actual device is made closer to a target wavelength is utilized.

Abstract: A device and method for controlling the temperature of a semiconductor module in which the semiconductor module is sandwiched by a first supporting unit and a second supporting unit. An area of the second supporting unit with which the semiconductor module comes into contact is shielded from heat of external ambient atmosphere, and has a temperature sensor provided thereat. The temperature of the first supporting unit is controlled so that the temperature of this area becomes equal to a predetermined temperature. The amount of heat moving from the heat-shielded area to the semiconductor module is small, so that the difference between the temperatures in the region extending from the heat-shielded area and the semiconductor module is small. The first and second supporting units may be separately controlled at different predetermined temperatures. By this, changes in the temperature of the semiconductor module caused by changes in outside air temperature are reduced.

Abstract: An optical communication module includes: a laser light emitting unit that emits laser light; a temperature control unit that controls the temperature of the laser light emitting unit; a power intensity control unit that controls the power intensity of the laser light emitted from the laser light emitting unit; and a setting value storage unit that stores a setting value determined from an optimum power intensity that maintains a predetermined wavelength and satisfies predetermined temperature conditions and predetermined power intensity conditions, and from an optimum temperature that maintains the predetermined wavelength and satisfies the predetermined temperature conditions and the predetermined power intensity conditions. In this optical communication module, the temperature control unit and the power intensity control unit control the temperature and the power intensity of the laser light emitting unit, based on the setting value stored in the setting value storage unit.

Abstract: An optical device measuring apparatus includes a photodetector receiving light emitted from an optical device, and an introduction portion for introducing the emitted light transmitted through the photodetector to an optical fiber.

Abstract: A device and method for controlling the temperature of a semiconductor module in which the semiconductor module is sandwiched by a first supporting unit and a second supporting unit. An area of the second supporting unit with which the semiconductor module comes into contact is shielded from heat of external ambient atmosphere, and has a temperature sensor provided thereat. The temperature of the first supporting unit is controlled so that the temperature of this area becomes equal to a predetermined temperature. The amount of heat moving from the heat-shielded area to the semiconductor module is small, so that the difference between the temperatures in the region extending from the heat-shielded area and the semiconductor module is small. The first and second supporting units may be separately controlled at different predetermined temperatures. By this, changes in the temperature of the semiconductor module caused by changes in outside air temperature are reduced.

Abstract: In order to tune an oscillation wavelength of a semiconductor laser diode to a target wavelength, the amount of change of a wavelength to the amount of change of a wavelength varying item is determined by actual measurement and a basic wavelength coefficient is renewed by using the ratio of both amounts of change as a corrective wavelength coefficient, and thus the characteristic when the wavelength of an actual device is made closer to a target wavelength is utilized.

Abstract: In the semiconductor laser module testing device, a temperature control power source changes a temperature of a wavelength locker module, and a wavelength monitoring bias circuit detects an output of a wavelength monitor in the changed temperature range and computes a correlation between a temperature of a semiconductor laser and a wavelength of light output therefrom. Moreover, the wavelength of the output light is locked by controlling the temperature of the wavelength locker module while feeding back the output of the wavelength monitor by a wavelength feedback circuit based on the obtained correlation between the temperature and the wavelength.