Patents by Inventor Harvey Allard

Harvey Allard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Luminescent pop-up candy
    Publication number: 20050252384
    Abstract: An illuminated pop-up candy comprising a housing, cap, moveable candy, moveable illumination system, and switching mechanism. The candy is able to translate and rotate along the length of the housing by the application of pressure to either the candy or the illumination system. The illumination system is switched on and off by touch or translation of the illumination along said housing.
    Type: Application
    Filed: May 12, 2005
    Publication date: November 17, 2005
    Inventors: Harvey Allard, Thomas Ference
  • System for and method of testing a microelectronic device using a dual probe technique
    Patent number: 6791344
    Abstract: A system (10) for and method of testing a device under test (DUT) (12) having a plurality of probe pads (14) utilizing a dual probe technique to overcome contact resistance that may be present. The system comprises a plurality of sensing probes (30) and a plurality of forcing probes (32) arranged in pairs consisting of one sensing probe and one forcing probe. Each pair of sensing and forcing probes is provided for contacting one of the probe pads on the DUT. Each forcing probe is in electrical communication with a power supply (20) via a switching matrix (24), and each sensing probe is in electrical communication with a voltage meter (52) via the switching matrix. During testing, at least one of the power supplies provides a voltage to a corresponding forcing probe in contact with a particular probe pad.
    Type: Grant
    Filed: December 28, 2000
    Date of Patent: September 14, 2004
    Assignee: International Business Machines Corporation
    Inventors: Donald J. Cook, Harvey Allard
  • System for and method of testing a microelectronic device using a dual probe technique
    Publication number: 20020084795
    Abstract: A system (10) for and method of testing a device under test (DUT) (12) having a plurality of probe pads (14) utilizing a dual probe technique to overcome contact resistance that may be present. The system comprises a plurality of sensing probes (30) and a plurality of forcing probes (32) arranged in pairs consisting of one sensing probe and one forcing probe. Each pair of sensing and forcing probes is provided for contacting one of the probe pads on the DUT. Each forcing probe is in electrical communication with a power supply (20) via a switching matrix (24), and each sensing probe is in electrical communication with a voltage meter (52) via the switching matrix. During testing, at least one of the power supplies provides a voltage to a corresponding forcing probe in contact with a particular probe pad.
    Type: Application
    Filed: December 28, 2000
    Publication date: July 4, 2002
    Inventors: Donald J. Cook, Harvey Allard