Abstract: A universal test fixture for electrically connecting a plurality of component pins to compute test logic without the need for specialized sockets is described. The test fixture comprises a planar dielectric substrate having a multi-conductor pattern on the top surface comprising a plurality of equal width, spaced conductor bars, and including electrical conductors for connecting the spaced conductor bars to test logic. Also provided is a resiliently deformable member or material for compensating for varying planarity between the tips of the component pins to be tested.