Abstract: A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. A plurality of consecutive data tracks are written, and after writing to the plurality of consecutive data tracks, a first number of the consecutive data tracks are read and a second number of the consecutive data tracks are skipped, wherein the second number of data tracks are interleaved with the first number of data tracks. Defects in the data tracks are detected in response to reading the first number of data tracks.

Abstract: A disk drive is disclosed that enables defect margining during disk drive burn-in testing. The disk drive comprises: a disk comprising a plurality of tracks; a head actuated over the disk; and a processor. The processor is configured to: perform disk drive burn-in testing to detect media defects; generate an initial defect list based upon detected media defects for sectors; generate an extended defect list that includes detected media defects and extended defect margins from the detected media defects; and utilize the extended defect list for burn-in, wherein a spare area of the disk allows for the detected media defects and the extended defect margins.

Abstract: A data storage device comprising a non-volatile media including a plurality of segments, and configured to store a defect list, and a controller configured to perform a defect management process. The defect management process can include testing the plurality of segments for defects, detecting a defect in a first segment of the plurality of segments, updating the defect list to include the first segment, determining a defective space amount based on the segments in the updated defect list, determining whether the defective space amount indicates a storage capacity error, transmitting a storage capacity error signal to the test system when the defective space amount indicates the storage capacity error, and when the defective space amount does not indicate the storage capacity error, continuing to test the plurality of segments for defects until the defective space amount indicates the storage capacity error or all the segments have been tested.