Abstract: A system and method corrects the phase of measurement signals obtained from remote heads during testing of a device. A first signal is transmitted along first and second transmission lines to respective remote heads. A shunt switch is connected between a remote end of the first transmission line and a first remote head, and another shunt switch is connected between a remote end of the second transmission line and a second remote head. The shunt switches in a first configuration respectively reflect the first signal back to a phase measurement apparatus as first and second reflected signals. The phase measurement apparatus determines a first reference phase and a second reference phase respectively based on the first and second reflected signals. A compensation unit compensates phase of the measurement signals based on the first and second reference phases.

Abstract: A system and method corrects the phase of measurement signals obtained from remote heads during testing of a device. A first signal is transmitted along first and second transmission lines to respective remote heads. A shunt switch is connected between a remote end of the first transmission line and a first remote head, and another shunt switch is connected between a remote end of the second transmission line and a second remote head. The shunt switches in a first configuration respectively reflect the first signal back to a phase measurement apparatus as first and second reflected signals. The phase measurement apparatus determines a first reference phase and a second reference phase respectively based on the first and second reflected signals. A compensation unit compensates phase of the measurement signals based on the first and second reference phases.

Abstract: Described is a directional coupler for forward coupling energy from an input port to a coupling port. The directional coupler has a coupling factor and an operating frequency and an operating wavelength corresponding to the operating frequency.

Abstract: A system for detecting responses of a MEMS resonator device includes first and second signal sources, a signal divider and a frequency mixer. The first signal source provides a first signal and the second signal source provides a second signal that electrostatically drives the MEMS resonator device, causing mechanical vibration. The signal divider divides the first signal into a probe signal and a local oscillator (LO) signal, the probe signal being applied to the MEMS resonator device and reflected by a capacitance of the MEMS resonator device. A reflection coefficient is modulated onto the reflected probe signal at the mechanical resonance frequency by variations in the capacitance induced by the mechanical vibration of the MEMS resonator device. The frequency mixer mixes the reflected probe signal and the LO signal and outputs an intermediate frequency (IF) signal, which represents modulation of the reflection coefficient, providing an image of the mechanical vibration.

Abstract: Described is a directional coupler for forward coupling energy from an input port to a coupling port. The directional coupler has a coupling factor and an operating frequency and an operating wavelength corresponding to the operating frequency.

Abstract: A system for detecting responses of a MEMS resonator device includes first and second signal sources, a signal divider and a frequency mixer. The first signal source provides a first signal and the second signal source provides a second signal that electrostatically drives the MEMS resonator device, causing mechanical vibration. The signal divider divides the first signal into a probe signal and a local oscillator (LO) signal, the probe signal being applied to the MEMS resonator device and reflected by a capacitance of the MEMS resonator device. A reflection coefficient is modulated onto the reflected probe signal at the mechanical resonance frequency by variations in the capacitance induced by the mechanical vibration of the MEMS resonator device. The frequency mixer mixes the reflected probe signal and the LO signal and outputs an intermediate frequency (IF) signal, which represents modulation of the reflection coefficient, providing an image of the mechanical vibration.

Abstract: An apparatus comprises: a first signal source; a dopant profile measurement module (DPPM) configured to receive a portion of the signal from the signal source; a probe tip connected to the reflective coupler; a load connected in parallel with the probe tip; and a second signal source connected to a load, wherein the signal source is configured to provide an amplitude-modulated (AM) signal to the probe tip. A method is also described.

Abstract: An apparatus comprises: a first signal source; a dopant profile measurement module (DPPM) configured to receive a portion of the signal from the signal source; a probe tip connected to the reflective coupler; a load connected in parallel with the probe tip; and a second signal source connected to a load, wherein the signal source is configured to provide an amplitude-modulated (AM) signal to the probe tip. A method is also described.

Abstract: A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral position. The pre-stressed shape is designated to provide a characteristic impedance of the signal coupling system that varies linearly as a function of displacement of the scanning probe from the neutral position when the scanning probe is displaced, relative to the neutral position, over a designated range of displacements.

Abstract: A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral position. The pre-stressed shape is designated to provide a characteristic impedance of the signal coupling system that varies linearly as a function of displacement of the scanning probe from the neutral position when the scanning probe is displaced, relative to the neutral position, over a designated range of displacements.

Abstract: A coupler assembly has first and second conductors with first and second dielectric supports extending along a coupling section and supporting the first and second conductors at a support section.

Abstract: A microwave spectroscopy probe has a center conductor between a first ground plane and a second ground plane. A dielectric member has fluid channel between the center conductor and the first ground plane.

Abstract: A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an offset stimulus source that provides a plurality of stimulus signals and a vector network analyzer. At least one stimulus signal is offset from another stimulus signal of the plurality in one or both of frequency and time-varying phase. The offset stimulus source includes a first signal source and a second signal source that respectively provides the offset stimulus signals. The method of measuring includes generating the offset stimulus signals and applying the offset stimulus signals to a balanced port of the DUT to stimulate the DUT. The performance parameters are determined from measurements of the offset stimulus signals and one or more response signals from the stimulated DUT.

Abstract: A microcircuit has a node thereon. A center conductor is electrically connected to the node and the center conductor has a length to minimum radius ratio of at least 50. A method of for providing electrical interconnections in a microcircuit, comprises the steps of depositing conductive bumps on the microcircuit; and aligning and bonding a center conductor to the conductive bumps, the center conductor having a first end and a second end, and the center conductor having a length to minimum radius ratio of at least 50.

Abstract: A vector network analyzer with one or more ports having each port comprising of an N-port signal separating network, where N>=6, an intermediate frequency (IF) filter interposing an RF downconverter and a power detector. The RF downconverter may be N-2 mixers or N-2 samplers. The IF downconverter (comprising N-2 IF filters and power detectors) may also be realized by an AID converter having N-2 inputs connected to a digital signal processor.

Abstract: A wafer support assembly has a first wafer support plate having a first grid pattern allowing first probe access through the first grid pattern to a first side of a wafer in the wafer support assembly and a second wafer support plate having a second grid pattern allowing second probe access through the second grid pattern to a second side of the wafer in the wafer support assembly.

Abstract: An interconnection includes a microcircuit package having a slot, and a receiving feature. A bead ring is fitted into the receiving feature. A center conductor extends through a dielectric support disposed in the bead ring and through the slot. The center conductor forms a coaxial transmission structure in cooperation with the bead ring and the dielectric support, and forms a slab line transmission structure in cooperation with the slot.

Abstract: A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an offset stimulus source that provides a plurality of stimulus signals and a vector network analyzer. At least one stimulus signal is offset from another stimulus signal of the plurality in one or both of frequency and time-varying phase. The offset stimulus source includes a first signal source and a second signal source that respectively provides the offset stimulus signals. The method of measuring includes generating the offset stimulus signals and applying the offset stimulus signals to a balanced port of the DUT to stimulate the DUT. The performance parameters are determined from measurements of the offset stimulus signals and one or more response signals from the stimulated DUT.

Abstract: A microwave spectroscopy probe has a center conductor between a first ground plane and a second ground plane. A dielectric member has fluid channel between the center conductor and the first ground plane.

Abstract: An adaptor includes a connector interface having a first coaxial structure with a first center pin configured to be coupled to a first center conductor of a first coaxial transmission line and a second coaxial structure with a second center pin configured to be coupled to a second center conductor of a second coaxial transmission line. A nut surrounds the first coaxial structure and the second coaxial structure.