Patents by Inventor Hatada Hiroshi

Hatada Hiroshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20010051404
    Abstract: A semiconductor device has pads that are arranged in such a manner as to easily accept manual needles to carry out a test. This technique is applicable to carry out a test with use of a boundary scan test circuit in synchronization with a cycle time defined by a normal operation clock signal. The semiconductor device has a first pad connected to a first one of registers that form a serial scan chain, to supply test data to the registers, a second pad connected to a last one of the registers, and a third pad to supply a test clock signal to the registers. The registers are arranged in a central part of the semiconductor device, and the first to third pads are arranged at the periphery of the semiconductor device.
    Type: Application
    Filed: June 11, 2001
    Publication date: December 13, 2001
    Inventors: Hatada Hiroshi, Otsuka Nobuaki, Hirabayashi Osamu, Kameda Yasushi