Patents by Inventor Hatsuo Yamazaki

Hatsuo Yamazaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for measuring plasma properties
    Patent number: 4707147
    Abstract: A device for measuring properties of plasma projects linearly polarized light to an object plasma as incident light, and the light coming from the plasma in response to the incident light is separated into an S-polarized component and a P-polarized component, so that temperature and other properties of the plasma are determined from such S- and P-polarized components.
    Type: Grant
    Filed: December 30, 1985
    Date of Patent: November 17, 1987
    Assignee: Hokkaido University
    Inventors: Yoshiaki Aoki, Naoyuki Kayukawa, Hatsuo Yamazaki, Yasutomo Ozawa, Hiroki Kitagawa