Patents by Inventor Hayato TAKIZAWA

Hayato TAKIZAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical measurement system, optical measurement method, and non-transitory storage medium having measurement program stored thereon
    Patent number: 11892281
    Abstract: An optical measurement system includes a light source, a spectroscopic detector, a reference sample, a switching mechanism that switches between a first optical path through which a sample to be measured is irradiated with light from the light source and light produced at the sample is guided to the spectroscopic detector and a second optical path through which the reference sample is irradiated with light from the light source and light produced at the reference sample is guided to the spectroscopic detector, and a processing unit that calculates, by performing correction processing based on change between a first detection result at first time and a second detection result at second time, a measurement value of the sample from a third detection result provided from the spectroscopic detector as a result of irradiation of the sample with light from the light source at third time temporally proximate to the second time.
    Type: Grant
    Filed: March 22, 2022
    Date of Patent: February 6, 2024
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Shiro Kawaguchi, Kazuya Nakajima, Hayato Takizawa, Goro Maeda
  • OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND NON-TRANSITORY STORAGE MEDIUM HAVING MEASUREMENT PROGRAM STORED THEREON
    Publication number: 20220316862
    Abstract: An optical measurement system includes a light source, a spectroscopic detector, a reference sample, a switching mechanism that switches between a first optical path through which a sample to be measured is irradiated with light from the light source and light produced at the sample is guided to the spectroscopic detector and a second optical path through which the reference sample is irradiated with light from the light source and light produced at the reference sample is guided to the spectroscopic detector, and a processing unit that calculates, by performing correction processing based on change between a first detection result at first time and a second detection result at second time, a measurement value of the sample from a third detection result provided from the spectroscopic detector as a result of irradiation of the sample with light from the light source at third time temporally proximate to the second time.
    Type: Application
    Filed: March 22, 2022
    Publication date: October 6, 2022
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Shiro KAWAGUCHI, Kazuya NAKAJIMA, Hayato TAKIZAWA, Goro MAEDA