Patents by Inventor He-Hsuan CHAO
He-Hsuan CHAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11653583Abstract: A resistive random access memory is provided. The resistive random access memory includes a bottom electrode, a metal oxide layer including a plurality of conductive filament regions formed on the bottom electrode, and a plurality of top electrodes formed on the metal oxide layer, corresponding to the respective conductive filament regions. Each of the conductive filament regions has a bottom portion and a top portion. The width of the bottom portion is greater than that of the top portion. The conductive filament regions include oxygen vacancies, and regions other than the conductive filament regions in the metal oxide layer are nitrogen-containing regions.Type: GrantFiled: July 7, 2020Date of Patent: May 16, 2023Assignee: WINBOND ELECTRONICS CORP.Inventors: Chang-Tsung Pai, Ming-Che Lin, Chi-Ching Liu, He-Hsuan Chao, Chia-Wen Cheng
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Publication number: 20230038604Abstract: A manufacturing method is provided. The method includes steps below. Forming bottom electrodes. Blanketly forming a resistance switching layer on the bottom electrodes. Forming a first insulating material layer on the resistance switching layer. Patterning the first insulating material layer to form insulating patterns. Conformally forming a channel layer having a plurality of channel regions on the resistance switching layer and the insulating patterns, wherein the plurality of channel regions are located on the resistance switching layer and cover opposite sides of the insulating patterns. Forming a second electrode material layer on the channel layer. Patterning the second electrode material layer to form top electrodes, each of the top electrodes is located in corresponding to one of the insulating patterns and covers at least two of the plurality of channel regions.Type: ApplicationFiled: October 4, 2022Publication date: February 9, 2023Applicant: Winbond Electronics Corp.Inventors: Chia-Wen Cheng, Ping-Kun Wang, Yi-Hsiu Chen, He-Hsuan Chao
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Patent number: 11520526Abstract: A write method for a resistive memory including a storage array, a control circuit and an access circuit is provided. The control circuit receives an external command to activate the access circuit to access the storage array. The write method includes determining whether the external command is ready to perform a write operation for the storage array; generating a first operation voltage group to the access circuit when the external command does not perform the write operation for the storage array; reading a count value of a block that corresponds to a write address when the external command performs the write operation for the storage array, wherein the count value indicates the number of times that the block corresponding to the write address performs the write operation; and generating a second operation voltage group to the access circuit according to the count value of the block.Type: GrantFiled: June 2, 2021Date of Patent: December 6, 2022Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, Chien-Min Wu, Chia Hua Ho, Frederick Chen, He-Hsuan Chao, Seow-Fong Lim
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Patent number: 11502131Abstract: A resistive random access memory (RRAM) device and a manufacturing method are provided. The RRAM device includes bottom electrodes, a resistance switching layer, insulating patterns, a channel layer and top electrodes. The resistance switching layer blanketly covers the bottom electrodes. The insulating patterns are disposed on the resistance layer and located in corresponding to locations of the bottom electrodes. The channel layer conformally covers the resistance switching layer and the insulating patterns. The channel layer has a plurality of channel regions. The channel regions are located on the resistance switching layer, and cover sidewalls of the insulating patterns. The top electrodes respectively cover at least two of the channel regions, and respectively located in corresponding to one of the insulating patterns, such that the at least two of the channel regions are located between one of the bottom electrodes and one of the top electrodes.Type: GrantFiled: November 19, 2020Date of Patent: November 15, 2022Assignee: Winbond Electronics Corp.Inventors: Chia-Wen Cheng, Ping-Kun Wang, Yi-Hsiu Chen, He-Hsuan Chao
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Patent number: 11362272Abstract: A resistive memory device and a reliability enhancement method thereof are provided. The reliability enhancement method includes the following steps. A forming operation is performed on a plurality of memory cells. The formed memory cells are read to respectively obtain a plurality of formed currents. A reference current is set according to a statistic value of the formed currents. A setting operation is performed on the memory cells. A ratio between a set current of each of the memory cells and the reference current is calculated, and a physical status of each of the memory cells is judged according to the ratio. It is determined whether to perform a fix operation of each of the memory cells or not according to physical status.Type: GrantFiled: August 25, 2020Date of Patent: June 14, 2022Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Chia-Wen Cheng, He-Hsuan Chao, Frederick Chen, Chang-Tsung Pai, Tzu-Yun Huang, Ming-Che Lin
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Publication number: 20220069209Abstract: A resistive memory device and a reliability enhancement method thereof are provided. The reliability enhancement method includes the following steps. A forming operation is performed on a plurality of memory cells. The formed memory cells are read to respectively obtain a plurality of formed currents. A reference current is set according to a statistic value of the formed currents. A setting operation is performed on the memory cells. A ratio between a set current of each of the memory cells and the reference current is calculated, and a physical status of each of the memory cells is judged according to the ratio. It is determined whether to perform a fix operation of each of the memory cells or not according to physical status.Type: ApplicationFiled: August 25, 2020Publication date: March 3, 2022Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Chia-Wen Cheng, He-Hsuan Chao, Frederick Chen, Chang-Tsung Pai, Tzu-Yun Huang, Ming-Che Lin
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Publication number: 20210286562Abstract: A write method for a resistive memory including a storage array, a control circuit and an access circuit is provided. The control circuit receives an external command to activate the access circuit to access the storage array. The write method includes determining whether the external command is ready to perform a write operation for the storage array; generating a first operation voltage group to the access circuit when the external command does not perform the write operation for the storage array; reading a count value of a block that corresponds to a write address when the external command performs the write operation for the storage array, wherein the count value indicates the number of times that the block corresponding to the write address performs the write operation; and generating a second operation voltage group to the access circuit according to the count value of the block.Type: ApplicationFiled: June 2, 2021Publication date: September 16, 2021Inventors: Ping-Kun WANG, Shao-Ching LIAO, Chien-Min WU, Chia Hua HO, Frederick CHEN, He-Hsuan CHAO, Seow-Fong LIM
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Patent number: 11055021Abstract: A resistive memory including a storage array, a storage circuit, a control circuit, a voltage generation circuit and an access circuit is provided. The storage array includes a plurality of blocks. Each block includes a plurality of memory cells. The storage circuit stores a plurality of count values. Each of the count values indicates the number of times that a corresponding block performs a write operation. The control circuit generates a control signal according to the count values when an external command is a write command. The voltage generation circuit provides an operation voltage group according to the control signal. The access circuit accesses the storage array according to the operation voltage group.Type: GrantFiled: March 14, 2019Date of Patent: July 6, 2021Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, Chien-Min Wu, Chia Hua Ho, Frederick Chen, He-Hsuan Chao, Seow-Fong Lim
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Publication number: 20210159275Abstract: A resistive random access memory (RRAM) device and a manufacturing method are provided. The RRAM device includes bottom electrodes, a resistance switching layer, insulating patterns, a channel layer and top electrodes. The resistance switching layer blanketly covers the bottom electrodes. The insulating patterns are disposed on the resistance layer and located in corresponding to locations of the bottom electrodes. The channel layer conformally covers the resistance switching layer and the insulating patterns. The channel layer has a plurality of channel regions. The channel regions are located on the resistance switching layer, and cover sidewalls of the insulating patterns. The top electrodes respectively cover at least two of the channel regions, and respectively located in corresponding to one of the insulating patterns, such that the at least two of the channel regions are located between one of the bottom electrodes and one of the top electrodes.Type: ApplicationFiled: November 19, 2020Publication date: May 27, 2021Applicant: Winbond Electronics Corp.Inventors: Chia-Wen Cheng, Ping-Kun Wang, Yi-Hsiu Chen, He-Hsuan Chao
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Patent number: 11011231Abstract: A data write-in method and a non-volatile memory are provided. The data write-in method includes: providing a reset voltage to a plurality of selected memory cells according to a first flag, and recursively performing a reset process for the plurality of selected memory cells; setting a second flag according to a plurality of first verification currents of the plurality of selected memory cells; and under a condition that the second flag is set: providing a set voltage to the plurality of selected memory cells according to a resistance of the plurality of selected memory cells; and setting the first flag according to a plurality of second verification currents of the plurality of selected memory cells.Type: GrantFiled: April 15, 2020Date of Patent: May 18, 2021Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Chang-Tsung Pai, Yu-Ting Chen, He-Hsuan Chao, Ming-Che Lin, Frederick Chen
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Publication number: 20210074356Abstract: A data write-in method and a non-volatile memory are provided. The data write-in method includes: providing a reset voltage to a plurality of selected memory cells according to a first flag, and recursively performing a reset process for the plurality of selected memory cells; setting a second flag according to a plurality of first verification currents of the plurality of selected memory cells; and under a condition that the second flag is set: providing a set voltage to the plurality of selected memory cells according to a resistance of the plurality of selected memory cells; and setting the first flag according to a plurality of second verification currents of the plurality of selected memory cells.Type: ApplicationFiled: April 15, 2020Publication date: March 11, 2021Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Chang-Tsung Pai, Yu-Ting Chen, He-Hsuan Chao, Ming-Che Lin, Frederick Chen
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Patent number: 10937495Abstract: A resistive memory and a method for writing data thereof are provided. The method for writing data includes: receiving a write-in data and generating an inverted write-in data; reading a current data in a plurality of selected memory cells; comparing the current data with the write-in data and the inverted write-in data; selecting the write-in data or the inverted write-in data to generate a final data according to a comparison result; and writing the final data into the selected memory cells.Type: GrantFiled: July 2, 2019Date of Patent: March 2, 2021Assignee: Winbond Electronics Corp.Inventors: He-Hsuan Chao, Ping-Kun Wang, Seow Fong Lim, Norio Hattori, Chien-Min Wu, Chih-Hua Hung
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Publication number: 20210013408Abstract: A resistive random access memory is provided. The resistive random access memory includes a bottom electrode, a metal oxide layer including a plurality of conductive filament regions formed on the bottom electrode, and a plurality of top electrodes formed on the metal oxide layer, corresponding to the respective conductive filament regions. Each of the conductive filament regions has a bottom portion and a top portion. The width of the bottom portion is greater than that of the top portion. The conductive filament regions include oxygen vacancies, and regions other than the conductive filament regions in the metal oxide layer are nitrogen-containing regions.Type: ApplicationFiled: July 7, 2020Publication date: January 14, 2021Inventors: Chang-Tsung PAI, Ming-Che LIN, Chi-Ching LIU, He-Hsuan CHAO, Chia-Wen CHENG
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Publication number: 20210005255Abstract: A resistive memory and a method for writing data thereof are provided. The method for writing data includes: receiving a write-in data and generating an inverted write-in data; reading a current data in a plurality of selected memory cells; comparing the current data with the write-in data and the inverted write-in data; selecting the write-in data or the inverted write-in data to generate a final data according to a comparison result; and writing the final data into the selected memory cells.Type: ApplicationFiled: July 2, 2019Publication date: January 7, 2021Applicant: Winbond Electronics Corp.Inventors: He-Hsuan Chao, Ping-Kun Wang, Seow Fong Lim, Norio Hattori, Chien-Min Wu, Chih-Hua Hung
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Patent number: 10770167Abstract: A memory storage apparatus and a forming method of a resistive memory device thereof are provided. A test forming voltage is applied to a redundant resistive memory device and a corresponding test current is read. A forming voltage applied to a main memory cell block is determined according to the test forming voltage, the test current, a forming current-voltage characteristic data and a target forming current.Type: GrantFiled: February 20, 2019Date of Patent: September 8, 2020Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Chien-Min Wu, He-Hsuan Chao, Chih-Cheng Fu, Shao-Ching Liao
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Publication number: 20200265914Abstract: A memory storage apparatus and a forming method of a resistive memory device thereof are provided. A test forming voltage is applied to a redundant resistive memory device and a corresponding test current is read. A forming voltage applied to a main memory cell block is determined according to the test forming voltage, the test current, a forming current-voltage characteristic data and a target forming current.Type: ApplicationFiled: February 20, 2019Publication date: August 20, 2020Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Chien-Min Wu, He-Hsuan Chao, Chih-Cheng Fu, Shao-Ching Liao
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Patent number: 10714157Abstract: A non-volatile memory and a reset method thereof are provided. The reset method includes: performing a first reset operation on a plurality of memory cells; recording a plurality of first verifying currents respectively corresponding to a plurality of first failure memory cells; performing a second reset operation on the first failure memory cells, and verifying second failure memory cells to obtain a plurality of second verifying currents; setting a first voltage modify flag according to a plurality of first ratios between the first verifying currents and the respectively corresponding second verifying currents; and adjusting a reset voltage for performing the first reset operation and the second reset operation according to the first voltage modify flag.Type: GrantFiled: August 27, 2019Date of Patent: July 14, 2020Assignee: Winbond Electronics Corp.Inventors: Ming-Che Lin, He-Hsuan Chao, Ping-Kun Wang, Seow Fong Lim, Ngatik Cheung, Chia-Wen Cheng
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Patent number: 10636842Abstract: A method for forming a resistive random access memory includes forming a layer stack, patterning the layer stack to form a plurality of stack structures, forming a protection layer along sidewalls of the plurality of stack structures, forming a first isolation structure between the plurality of stack structures, forming at least one recess in at least one stack structure to define a plurality of filament units, and forming a second isolation structure in the at least one recess. The layer stack includes a bottom electrode and a resistive switching layer on the bottom electrode.Type: GrantFiled: February 21, 2019Date of Patent: April 28, 2020Assignee: WINBOND ELECTRONICS CORP.Inventors: Chia-Wen Cheng, Yi-Hsiu Chen, Po-Yen Hsu, Ping-Kun Wang, Ming-Che Lin, He-Hsuan Chao
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Patent number: 10636486Abstract: A resistive memory including a first storage circuit, a verification circuit, a second storage circuit and a control circuit is provided. The first storage circuit includes various cell groups. Each of the cell groups includes at least one memory cell. The verification circuit is coupled to the first storage circuit to verify whether a specific operation performed on at least one of the memory cells was successful. The second storage circuit includes various flag bits. Each of the flag bits corresponds to a cell group. In a reset period, the control circuit is configured to perform a first reset operation or a second reset operation on a first memory cell of a specific cell group among the cell groups according to a specific flag bit corresponding to the specific cell group.Type: GrantFiled: March 26, 2019Date of Patent: April 28, 2020Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, He-Hsuan Chao, Chen-Lung Huang, Chi-Ching Liu, Chien-Min Wu
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Publication number: 20190369920Abstract: A resistive memory including a storage array, a storage circuit, a control circuit, a voltage generation circuit and an access circuit is provided. The storage array includes a plurality of blocks. Each block includes a plurality of memory cells. The storage circuit stores a plurality of count values. Each of the count values indicates the number of times that a corresponding block performs a write operation. The control circuit generates a control signal according to the count values when an external command is a write command. The voltage generation circuit provides an operation voltage group according to the control signal. The access circuit accesses the storage array according to the operation voltage group.Type: ApplicationFiled: March 14, 2019Publication date: December 5, 2019Inventors: Ping-Kun WANG, Shao-Ching LIAO, Chien-Min WU, Chia Hua HO, Frederick CHEN, He-Hsuan CHAO, Seow-Fong LIM