Patents by Inventor Heacheon Kim

Heacheon Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6933543
    Abstract: A high frequency switch device includes an epitaxy substrate that is formed by sequentially stacking an AlGaAs/GaAs superlattic buffer layer, a first Si planar doping layer, an undoped first AlGaAs spacer, an undoped InGaAs layer, an undoped second AlGaAs spacer, a second Si planar doping layer having a doping density greater than that of the first Si planar doping layer, and an undoped GaAs/AlGaAs capping layer on a GaAs semi-insulated substrate. The undoped GaAs/AlGaAs capping layer is formed with a source electrode and a drain electrode that form an ohmic contact with the undoped GaAs/AlGaAs capping layer thereon, and a gate electrode formed between the source electrode and the drain electrode, thereby forming a Schottky contact with the undoped GaAs/AlGaAs capping layer.
    Type: Grant
    Filed: June 22, 2004
    Date of Patent: August 23, 2005
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Jae Kyoung Mun, Hong Gu Ji, Hokyun Ahn, Heacheon Kim
  • Publication number: 20050121694
    Abstract: A high frequency switch device includes an epitaxy substrate that is formed by sequentially stacking an AlGaAs/GaAs superlattic buffer layer, a first Si planar doping layer, an undoped first AlGaAs spacer, an undoped InGaAs layer, an undoped second AlGaAs spacer, a second Si planar doping layer having a doping density greater than that of the first Si planar doping layer, and an undoped GaAs/AlGaAs capping layer on a GaAs semi-insulated substrate. The undoped GaAs/AlGaAs capping layer is formed with a source electrode and a drain electrode that form an ohmic contact with the undoped GaAs/AlGaAs capping layer thereon, and a gate electrode formed between the source electrode and the drain electrode, thereby forming a Schottky contact with the undoped GaAs/AlGaAs capping layer.
    Type: Application
    Filed: June 22, 2004
    Publication date: June 9, 2005
    Inventors: Jae Mun, Hong Ji, Hokyun Ahn, Heacheon Kim
  • Patent number: 6689667
    Abstract: The present invention relates to a photoreceiver and method of manufacturing the same. For the purpose of a selective detection of a specific wavelength, if a waveguide type photodetector using a multiple quantum-well layer having a quantum confined stark effect as an optical absorption layer, the wavelength that is absorbed by the stark effect by which the transition energy edge of the optical absorption band is varied depending on the intensity of an electric field applied to the multiple quantum-well layer is varied. Thus, a wavelength selective detection characteristic can be varied simply implemented. The waveguide type photodetector of this structure is integrated on a semi-insulating InP substrate with a heterogeneous bipolar transistor having an n+InP/p+InGaAs/n−InGaAs/n+InGaAsP high-gain amplification characteristic.
    Type: Grant
    Filed: July 30, 2002
    Date of Patent: February 10, 2004
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Eun soo Nam, Heacheon Kim
  • Publication number: 20030222265
    Abstract: The present invention relates to a photoreceiver and method of manufacturing the same. For the purpose of a selective detection of a specific wavelength, if a waveguide type photodetector using a multiple quantum-well layer having a quantum confined stark effect as an optical absorption layer, the wavelength that is absorbed by the stark effect by which the transition energy edge of the optical absorption band is varied depending on the intensity of an electric field applied to the multiple quantum-well layer is varied. Thus, a wavelength selective detection characteristic can be varied simply implemented. The waveguide type photodetector of this structure is integrated on a semi-insulating InP substrate with a heterogeneous bipolar transistor having an n+InP/p+InGaAs/n−InGaAs/n+InGaAsP high-gain amplification characteristic.
    Type: Application
    Filed: July 30, 2002
    Publication date: December 4, 2003
    Inventors: Eun Soo Nam, Heacheon Kim