Abstract: A selector according to an embodiment of the present disclosure includes a first electrode; a second electrode disposed opposite to the first electrode; an ion supply layer disposed between the first electrode and the second electrode to be on the side of the first electrode and doped with a metal, wherein the doped metal diffuses toward the second electrode; a switching layer disposed between the first electrode and the second electrode to be on the side of the second electrode, wherein the doped metal diffuses from the ion supply layer into the switching layer so that metal concentration distribution inside the switching layer is changed to generate metal filaments; and a diffusion control layer inserted between the ion supply layer and the switching layer, wherein the diffusion control layer serves to adjust electrical characteristics related to the generated metal filaments as the amount of the diffusing metal is adjusted in proportion to a thickness of the diffusion control layer.

Abstract: A scan driver includes scan signal outputting circuits, at least one of the scan signal outputting circuits includes a driving circuit and a buffer circuit. The driving circuit includes driving transistors. The driving circuit provides first and second driving signals to first and second driving nodes, respectively by turning on or off the driving transistors in response to clock signals and a scan input signal. The buffer circuit includes buffer transistors. The buffer circuit outputs a scan signal at an output node by turning on or off the buffer transistors in response to the first and second driving signals. The at least one of the scan signal outputting circuits performs a back-biasing voltage applying operation on at least one of the driving transistors and the buffer transistors when the driving transistors and the buffer transistors are turned on or off.

Abstract: A scan driver includes scan signal outputting circuits, at least one of the scan signal outputting circuits includes a driving circuit and a buffer circuit. The driving circuit includes driving transistors. The driving circuit provides first and second driving signals to first and second driving nodes, respectively by turning on or off the driving transistors in response to clock signals and a scan input signal. The buffer circuit includes buffer transistors. The buffer circuit outputs a scan signal at an output node by turning on or off the buffer transistors in response to the first and second driving signals. The at least one of the scan signal outputting circuits performs a back-biasing voltage applying operation on at least one of the driving transistors and the buffer transistors when the driving transistors and the buffer transistors are turned on or off.