Patents by Inventor Heather Gamble

Heather Gamble has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Off-axis ionization devices and systems using them
    Patent number: 10658167
    Abstract: An ion source comprising a chamber and an electron collector is described. In one configuration, the chamber comprises a sample inlet and an ion outlet. The chamber may also include an electron inlet configured to receive electrons from an electron source. The electron collector can be arranged in opposition to the electron inlet. The chamber can be configured to direct an electron beam from the electron source along a path with the chamber transverse to a path between the gas inlet and the ion outlet. The chamber may comprise an ion guide that includes a guide axis offset from an axis of the ion outlet.
    Type: Grant
    Filed: September 29, 2018
    Date of Patent: May 19, 2020
    Assignee: PerkinElmer Health Sciences Canada, Inc.
    Inventors: Heather Gamble, Gholamreza Javahery, Lisa Cousins, Charles Jolliffe
  • Dual chamber electron impact and chemical ionization source
    Patent number: 10636645
    Abstract: A mass analyzer includes two chambers for ionizing gas to form ions and/or introducing reaction gases to aid in ionization. A first chamber includes an electron to allow electron bombardment of a first gas. A second chamber receives a second gas and ions from the first chamber to allow interaction between the second gas, and the ions from the first chamber. The first and/or second gas may include analyte.
    Type: Grant
    Filed: April 20, 2018
    Date of Patent: April 28, 2020
    Assignee: PerkinElmer Health Sciences Canada, Inc.
    Inventors: Heather Gamble, Gholamreza Javahery, Lisa Cousins, Charles Jolliffe, Miles Snow
  • DUAL CHAMBER ELECTRON IMPACT AND CHEMICAL IONIZATION SOURCE
    Publication number: 20190326109
    Abstract: A mass analyzer includes two chambers for ionizing gas to form ions and/or introducing reaction gases to aid in ionization. A first chamber includes an electron to allow electron bombardment of a first gas. A second chamber receives a second gas and ions from the first chamber to allow interaction between the second gas, and the ions from the first chamber. The first and/or second gas may include analyte.
    Type: Application
    Filed: April 20, 2018
    Publication date: October 24, 2019
    Inventors: Heather GAMBLE, Gholamreza JAVAHERY, Lisa COUSINS, Charles JOLLIFFE
  • OFF-AXIS IONIZATION DEVICES AND SYSTEMS USING THEM
    Publication number: 20190189417
    Abstract: An ion source comprising a chamber and an electron collector is described. In one configuration, the chamber comprises a sample inlet and an ion outlet. The chamber may also include an electron inlet configured to receive electrons from an electron source. The electron collector can be arranged in opposition to the electron inlet. The chamber can be configured to direct an electron beam from the electron source along a path with the chamber transverse to a path between the gas inlet and the ion outlet. The chamber may comprise an ion guide that includes a guide axis offset from an axis of the ion outlet.
    Type: Application
    Filed: September 29, 2018
    Publication date: June 20, 2019
    Inventors: Heather Gamble, Gholamreza Javahery, Lisa Cousins, Charles Jolliffe