Patents by Inventor Hedvika Vocilkova

Hedvika Vocilkova has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of Automatic Detection of Required Peak for Sample Machining by Focused Ion Beam
    Publication number: 20230215689
    Abstract: A method of automatic detection of a required peak for sample machining by a focused ion beam uses for a filtration of a measured signal of secondary particles of a discrete wavelet transformation followed by a peak detection, and stops sample machining after the required a number of peaks has been reached.
    Type: Application
    Filed: June 2, 2021
    Publication date: July 6, 2023
    Applicant: TESCAN Brno, s.r.o.
    Inventors: Sharang Sharang, Hedvika Vocilkova