Abstract: The temperature sensor includes a voltage generator and a temperature code generator. The voltage generator includes a first temperature element having a first resistance value and a second temperature element having a second resistance value and utilizes the first and second temperature elements to generate a temperature voltage signal having a voltage level that varies according to a variation in temperature. The voltage generator generates a reference voltage signal having a substantially constant voltage level regardless of the variation in temperature. The temperature code generator compares a voltage level of the temperature voltage signal with a voltage level of the reference voltage signal to generate a plurality of temperature code signals including information on the variation in temperature based on the comparison.

Abstract: The temperature sensor includes a voltage generator and a temperature code generator. The voltage generator includes a first temperature element having a first resistance value and a second temperature element having a second resistance value and utilizes the first and second temperature elements to generate a temperature voltage signal having a voltage level that varies according to a variation in temperature. The voltage generator generates a reference voltage signal having a substantially constant voltage level regardless of the variation in temperature. The temperature code generator compares a voltage level of the temperature voltage signal with a voltage level of the reference voltage signal to generate a plurality of temperature code signals including information on the variation in temperature based on the comparison.

Abstract: The temperature sensor includes a voltage generator and a temperature code generator. The voltage generator includes a first temperature element having a first resistance value and a second temperature element having a second resistance value and utilizes the first and second temperature elements to generate a temperature voltage signal having a voltage level that varies according to a variation in temperature. The voltage generator generates a reference voltage signal having a substantially constant voltage level regardless of the variation in temperature. The temperature code generator compares a voltage level of the temperature voltage signal with a voltage level of the reference voltage signal to generate a plurality of temperature code signals including information on the variation in temperature based on the comparison.

Abstract: A semiconductor apparatus includes a first memory bank configured to store data transmitted through a first data line; and a precharge block configured to precharge the first data line to a level of a first voltage or a second voltage.

Abstract: A semiconductor system includes a controller and a semiconductor device. The controller receives a temperature code signal and responsively generates a mode set signal operable to adjust a level variation and a voltage variation rate of a temperature voltage signal, wherein the temperature voltage signal level varies according to temperature when a logic level combination of the temperature code signal is different from a predefined logic level combination. The semiconductor device generates the temperature voltage signal from a drivability and a resistance value set by the mode set signal. The semiconductor device generates the temperature code signal based on a comparison of the temperature voltage signal and a reference voltage signal.

Abstract: A semiconductor apparatus includes a first memory bank configured to store data transmitted through a first data line; and a precharge block configured to precharge the first data line to a level of a first voltage or a second voltage.

Abstract: A semiconductor system includes a controller and a semiconductor device. The controller receives a temperature code signal and responsively generates a mode set signal operable to adjust a level variation and a voltage variation rate of a temperature voltage signal, wherein the temperature voltage signal level varies according to temperature when a logic level combination of the temperature code signal is different from a predefined logic level combination. The semiconductor device generates the temperature voltage signal from a drivability and a resistance value set by the mode set signal. The semiconductor device generates the temperature code signal based on a comparison of the temperature voltage signal and a reference voltage signal.

Abstract: The temperature sensor includes a voltage generator and a temperature code generator. The voltage generator includes a first temperature element having a first resistance value and a second temperature element having a second resistance value and utilizes the first and second temperature elements to generate a temperature voltage signal having a voltage level that varies according to a variation in temperature. The voltage generator generates a reference voltage signal having a substantially constant voltage level regardless of the variation in temperature. The temperature code generator compares a voltage level of the temperature voltage signal with a voltage level of the reference voltage signal to generate a plurality of temperature code signals including information on the variation in temperature based on the comparison.

Abstract: Temperature sensors are provided. The temperature sensor includes a comparison voltage generator and a temperature voltage generator. The comparison voltage generator generates a first comparison voltage signal whose level varies according to temperature variation and a second comparison voltage signal whose level is constant regardless of temperature variation. The temperature voltage generator generates a first internal current signal whose level varies according to a level of the first comparison voltage signal and a second internal current signal whose level varies according to a level of the second comparison voltage signal. Further, the temperature voltage generator amplifies a current difference between the first and second internal current signals to generate a temperature voltage signal.

Abstract: A semiconductor integrated circuit includes first and second bank groups, a first internal voltage control unit configured to generate a first enable pulse which is enabled when a first read operation or a first write operation is performed for banks included in the first bank group, and a first internal voltage generation unit configured to generate and supply a first internal voltage to the first bank group in response to the first enable pulse, wherein an enable period of the first enable pulse is set to be longer in the first write operation than in the first read operation.

Abstract: A semiconductor integrated circuit includes first and second bank groups, a first internal voltage control unit configured to generate a first enable pulse which is enabled when a first read operation or a first write operation is performed for banks included in the first bank group, and a first internal voltage generation unit configured to generate and supply a first internal voltage to the first bank group in response to the first enable pulse, wherein an enable period of the first enable pulse is set to be longer in the first write operation than in the first read operation.